Development of scanning X-ray microscopes for materials science spectromicroscopy at the Advanced Light Source

The development of two zone‐plate microscopes for X‐ray spectroscopic analysis of materials is described. This pair of instruments will provide imaging NEXAFS analysis of samples in transmission at atmospheric pressure and imaging XPS and NEXAFS analysis of sample surfaces in a UHV environment.

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Bibliographic Details
Published in:Journal of synchrotron radiation 1998-05, Vol.5 (3), p.1090-1092
Main Authors: Warwick, T., Ade, H., Cerasari, S., Denlinger, J., Franck, K., Garcia, A., Hayakawa, S., Hitchcock, A., Kikuma, J., Klingler, S., Kortright, J., Morisson, G., Moronne, M., Rightor, E., Rotenberg, E., Seal, S., Shin, H.-J., Steele, W. F., Tonner, B. P.
Format: Article
Language:English
Subjects:
ADVANCED LIGHT SOURCE
ADVANCED LIGHT SOURCE ALS
MICROSCOPES
NEXAFS
PARTICLE ACCELERATORS
spectromicroscopy
SYNCHROTRON RADIATION
XPS
zone plates
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Description
Summary:The development of two zone‐plate microscopes for X‐ray spectroscopic analysis of materials is described. This pair of instruments will provide imaging NEXAFS analysis of samples in transmission at atmospheric pressure and imaging XPS and NEXAFS analysis of sample surfaces in a UHV environment.
ISSN:1600-5775
0909-0495
1600-5775
DOI:10.1107/S0909049597014283