Loading…
Development of scanning X-ray microscopes for materials science spectromicroscopy at the Advanced Light Source
The development of two zone‐plate microscopes for X‐ray spectroscopic analysis of materials is described. This pair of instruments will provide imaging NEXAFS analysis of samples in transmission at atmospheric pressure and imaging XPS and NEXAFS analysis of sample surfaces in a UHV environment.
Saved in:
| Published in: | Journal of synchrotron radiation 1998-05, Vol.5 (3), p.1090-1092 |
|---|---|
| Main Authors: | , , , , , , , , , , , , , , , , , , |
| Format: | Article |
| Language: | English |
| Subjects: | |
| Citations: | Items that cite this one |
| Online Access: | Request full text |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| cited_by | cdi_FETCH-LOGICAL-c4542-f12f850dddd3f4f632c985c158e2fa4f63e07e7a6121c67b2edfd57aad70966c3 |
|---|---|
| cites | |
| container_end_page | 1092 |
| container_issue | 3 |
| container_start_page | 1090 |
| container_title | Journal of synchrotron radiation |
| container_volume | 5 |
| creator | Warwick, T. Ade, H. Cerasari, S. Denlinger, J. Franck, K. Garcia, A. Hayakawa, S. Hitchcock, A. Kikuma, J. Klingler, S. Kortright, J. Morisson, G. Moronne, M. Rightor, E. Rotenberg, E. Seal, S. Shin, H.-J. Steele, W. F. Tonner, B. P. |
| description | The development of two zone‐plate microscopes for X‐ray spectroscopic analysis of materials is described. This pair of instruments will provide imaging NEXAFS analysis of samples in transmission at atmospheric pressure and imaging XPS and NEXAFS analysis of sample surfaces in a UHV environment. |
| doi_str_mv | 10.1107/S0909049597014283 |
| format | article |
| fullrecord | <record><control><sourceid>proquest_24P</sourceid><recordid>TN_cdi_osti_scitechconnect_794879</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>817618465</sourcerecordid><originalsourceid>FETCH-LOGICAL-c4542-f12f850dddd3f4f632c985c158e2fa4f63e07e7a6121c67b2edfd57aad70966c3</originalsourceid><addsrcrecordid>eNqFkU1vFSEUhonR2Fr9AW4MrlxNBWaAmWXT2g-9avTWrxWhzKEXOwMjcKv338vN3FQTF8KCE_I8bw4chJ5SckgpkS-XpCu76XgnCW1YW99D-1QQUnEp-f2_6j30KKXvhFAhWf0Q7VHORC0530f-BG5hCNMIPuNgcTLae-ev8dcq6g0enYkhmTBBwjZEPOoM0ekhFdCBN4DTBCbHcAdusM44rwAf9be6AD1euOtVxsuwjgYeowe22PBkdx6gT6evLo_Pq8X7s4vjo0VlGt6wylJmW076smrbWFEz07XcUN4Cs3p7AUSC1IIyaoS8YtDbnkute0k6IUx9gJ7PuSFlp0qvGczKBO9Ls0p2TSu7wryYmSmGH2tIWY0uGRgG7SGsk2qpFLRtBC8kncntG1MEq6boRh03ihK1nYT6ZxLFebZLX1-N0P8xdl9fgHYGfroBNv9PVK-X395c1Iyzolaz6lKGX3eqjjdKyBKuvrw7U58_nLKTj28vFal_A7wNpFk</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>817618465</pqid></control><display><type>article</type><title>Development of scanning X-ray microscopes for materials science spectromicroscopy at the Advanced Light Source</title><source>Wiley Online Library Open Access</source><creator>Warwick, T. ; Ade, H. ; Cerasari, S. ; Denlinger, J. ; Franck, K. ; Garcia, A. ; Hayakawa, S. ; Hitchcock, A. ; Kikuma, J. ; Klingler, S. ; Kortright, J. ; Morisson, G. ; Moronne, M. ; Rightor, E. ; Rotenberg, E. ; Seal, S. ; Shin, H.-J. ; Steele, W. F. ; Tonner, B. P.</creator><creatorcontrib>Warwick, T. ; Ade, H. ; Cerasari, S. ; Denlinger, J. ; Franck, K. ; Garcia, A. ; Hayakawa, S. ; Hitchcock, A. ; Kikuma, J. ; Klingler, S. ; Kortright, J. ; Morisson, G. ; Moronne, M. ; Rightor, E. ; Rotenberg, E. ; Seal, S. ; Shin, H.-J. ; Steele, W. F. ; Tonner, B. P. ; Ernest Orlando Lawrence Berkeley National Lab., Advanced Light Source, Berkeley, CA (US)</creatorcontrib><description>The development of two zone‐plate microscopes for X‐ray spectroscopic analysis of materials is described. This pair of instruments will provide imaging NEXAFS analysis of samples in transmission at atmospheric pressure and imaging XPS and NEXAFS analysis of sample surfaces in a UHV environment.</description><identifier>ISSN: 1600-5775</identifier><identifier>ISSN: 0909-0495</identifier><identifier>EISSN: 1600-5775</identifier><identifier>DOI: 10.1107/S0909049597014283</identifier><identifier>PMID: 15263755</identifier><language>eng</language><publisher>5 Abbey Square, Chester, Cheshire CH1 2HU, England: International Union of Crystallography</publisher><subject>ADVANCED LIGHT SOURCE ; ADVANCED LIGHT SOURCE ALS ; MICROSCOPES ; NEXAFS ; PARTICLE ACCELERATORS ; spectromicroscopy ; SYNCHROTRON RADIATION ; XPS ; zone plates</subject><ispartof>Journal of synchrotron radiation, 1998-05, Vol.5 (3), p.1090-1092</ispartof><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c4542-f12f850dddd3f4f632c985c158e2fa4f63e07e7a6121c67b2edfd57aad70966c3</citedby></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://onlinelibrary.wiley.com/doi/pdf/10.1107%2FS0909049597014283$$EPDF$$P50$$Gwiley$$H</linktopdf><linktohtml>$$Uhttps://onlinelibrary.wiley.com/doi/full/10.1107%2FS0909049597014283$$EHTML$$P50$$Gwiley$$H</linktohtml><link.rule.ids>230,314,780,784,885,11562,27924,27925,46052,46476</link.rule.ids><linktorsrc>$$Uhttps://onlinelibrary.wiley.com/doi/abs/10.1107%2FS0909049597014283$$EView_record_in_Wiley-Blackwell$$FView_record_in_$$GWiley-Blackwell</linktorsrc><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/15263755$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink><backlink>$$Uhttps://www.osti.gov/biblio/794879$$D View this record in Osti.gov$$Hfree_for_read</backlink></links><search><creatorcontrib>Warwick, T.</creatorcontrib><creatorcontrib>Ade, H.</creatorcontrib><creatorcontrib>Cerasari, S.</creatorcontrib><creatorcontrib>Denlinger, J.</creatorcontrib><creatorcontrib>Franck, K.</creatorcontrib><creatorcontrib>Garcia, A.</creatorcontrib><creatorcontrib>Hayakawa, S.</creatorcontrib><creatorcontrib>Hitchcock, A.</creatorcontrib><creatorcontrib>Kikuma, J.</creatorcontrib><creatorcontrib>Klingler, S.</creatorcontrib><creatorcontrib>Kortright, J.</creatorcontrib><creatorcontrib>Morisson, G.</creatorcontrib><creatorcontrib>Moronne, M.</creatorcontrib><creatorcontrib>Rightor, E.</creatorcontrib><creatorcontrib>Rotenberg, E.</creatorcontrib><creatorcontrib>Seal, S.</creatorcontrib><creatorcontrib>Shin, H.-J.</creatorcontrib><creatorcontrib>Steele, W. F.</creatorcontrib><creatorcontrib>Tonner, B. P.</creatorcontrib><creatorcontrib>Ernest Orlando Lawrence Berkeley National Lab., Advanced Light Source, Berkeley, CA (US)</creatorcontrib><title>Development of scanning X-ray microscopes for materials science spectromicroscopy at the Advanced Light Source</title><title>Journal of synchrotron radiation</title><addtitle>J. Synchrotron Rad</addtitle><description>The development of two zone‐plate microscopes for X‐ray spectroscopic analysis of materials is described. This pair of instruments will provide imaging NEXAFS analysis of samples in transmission at atmospheric pressure and imaging XPS and NEXAFS analysis of sample surfaces in a UHV environment.</description><subject>ADVANCED LIGHT SOURCE</subject><subject>ADVANCED LIGHT SOURCE ALS</subject><subject>MICROSCOPES</subject><subject>NEXAFS</subject><subject>PARTICLE ACCELERATORS</subject><subject>spectromicroscopy</subject><subject>SYNCHROTRON RADIATION</subject><subject>XPS</subject><subject>zone plates</subject><issn>1600-5775</issn><issn>0909-0495</issn><issn>1600-5775</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1998</creationdate><recordtype>article</recordtype><recordid>eNqFkU1vFSEUhonR2Fr9AW4MrlxNBWaAmWXT2g-9avTWrxWhzKEXOwMjcKv338vN3FQTF8KCE_I8bw4chJ5SckgpkS-XpCu76XgnCW1YW99D-1QQUnEp-f2_6j30KKXvhFAhWf0Q7VHORC0530f-BG5hCNMIPuNgcTLae-ev8dcq6g0enYkhmTBBwjZEPOoM0ekhFdCBN4DTBCbHcAdusM44rwAf9be6AD1euOtVxsuwjgYeowe22PBkdx6gT6evLo_Pq8X7s4vjo0VlGt6wylJmW076smrbWFEz07XcUN4Cs3p7AUSC1IIyaoS8YtDbnkute0k6IUx9gJ7PuSFlp0qvGczKBO9Ls0p2TSu7wryYmSmGH2tIWY0uGRgG7SGsk2qpFLRtBC8kncntG1MEq6boRh03ihK1nYT6ZxLFebZLX1-N0P8xdl9fgHYGfroBNv9PVK-X395c1Iyzolaz6lKGX3eqjjdKyBKuvrw7U58_nLKTj28vFal_A7wNpFk</recordid><startdate>199805</startdate><enddate>199805</enddate><creator>Warwick, T.</creator><creator>Ade, H.</creator><creator>Cerasari, S.</creator><creator>Denlinger, J.</creator><creator>Franck, K.</creator><creator>Garcia, A.</creator><creator>Hayakawa, S.</creator><creator>Hitchcock, A.</creator><creator>Kikuma, J.</creator><creator>Klingler, S.</creator><creator>Kortright, J.</creator><creator>Morisson, G.</creator><creator>Moronne, M.</creator><creator>Rightor, E.</creator><creator>Rotenberg, E.</creator><creator>Seal, S.</creator><creator>Shin, H.-J.</creator><creator>Steele, W. F.</creator><creator>Tonner, B. P.</creator><general>International Union of Crystallography</general><scope>BSCLL</scope><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7X8</scope><scope>OTOTI</scope></search><sort><creationdate>199805</creationdate><title>Development of scanning X-ray microscopes for materials science spectromicroscopy at the Advanced Light Source</title><author>Warwick, T. ; Ade, H. ; Cerasari, S. ; Denlinger, J. ; Franck, K. ; Garcia, A. ; Hayakawa, S. ; Hitchcock, A. ; Kikuma, J. ; Klingler, S. ; Kortright, J. ; Morisson, G. ; Moronne, M. ; Rightor, E. ; Rotenberg, E. ; Seal, S. ; Shin, H.-J. ; Steele, W. F. ; Tonner, B. P.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c4542-f12f850dddd3f4f632c985c158e2fa4f63e07e7a6121c67b2edfd57aad70966c3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1998</creationdate><topic>ADVANCED LIGHT SOURCE</topic><topic>ADVANCED LIGHT SOURCE ALS</topic><topic>MICROSCOPES</topic><topic>NEXAFS</topic><topic>PARTICLE ACCELERATORS</topic><topic>spectromicroscopy</topic><topic>SYNCHROTRON RADIATION</topic><topic>XPS</topic><topic>zone plates</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Warwick, T.</creatorcontrib><creatorcontrib>Ade, H.</creatorcontrib><creatorcontrib>Cerasari, S.</creatorcontrib><creatorcontrib>Denlinger, J.</creatorcontrib><creatorcontrib>Franck, K.</creatorcontrib><creatorcontrib>Garcia, A.</creatorcontrib><creatorcontrib>Hayakawa, S.</creatorcontrib><creatorcontrib>Hitchcock, A.</creatorcontrib><creatorcontrib>Kikuma, J.</creatorcontrib><creatorcontrib>Klingler, S.</creatorcontrib><creatorcontrib>Kortright, J.</creatorcontrib><creatorcontrib>Morisson, G.</creatorcontrib><creatorcontrib>Moronne, M.</creatorcontrib><creatorcontrib>Rightor, E.</creatorcontrib><creatorcontrib>Rotenberg, E.</creatorcontrib><creatorcontrib>Seal, S.</creatorcontrib><creatorcontrib>Shin, H.-J.</creatorcontrib><creatorcontrib>Steele, W. F.</creatorcontrib><creatorcontrib>Tonner, B. P.</creatorcontrib><creatorcontrib>Ernest Orlando Lawrence Berkeley National Lab., Advanced Light Source, Berkeley, CA (US)</creatorcontrib><collection>Istex</collection><collection>PubMed</collection><collection>CrossRef</collection><collection>MEDLINE - Academic</collection><collection>OSTI.GOV</collection><jtitle>Journal of synchrotron radiation</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Warwick, T.</au><au>Ade, H.</au><au>Cerasari, S.</au><au>Denlinger, J.</au><au>Franck, K.</au><au>Garcia, A.</au><au>Hayakawa, S.</au><au>Hitchcock, A.</au><au>Kikuma, J.</au><au>Klingler, S.</au><au>Kortright, J.</au><au>Morisson, G.</au><au>Moronne, M.</au><au>Rightor, E.</au><au>Rotenberg, E.</au><au>Seal, S.</au><au>Shin, H.-J.</au><au>Steele, W. F.</au><au>Tonner, B. P.</au><aucorp>Ernest Orlando Lawrence Berkeley National Lab., Advanced Light Source, Berkeley, CA (US)</aucorp><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Development of scanning X-ray microscopes for materials science spectromicroscopy at the Advanced Light Source</atitle><jtitle>Journal of synchrotron radiation</jtitle><addtitle>J. Synchrotron Rad</addtitle><date>1998-05</date><risdate>1998</risdate><volume>5</volume><issue>3</issue><spage>1090</spage><epage>1092</epage><pages>1090-1092</pages><issn>1600-5775</issn><issn>0909-0495</issn><eissn>1600-5775</eissn><abstract>The development of two zone‐plate microscopes for X‐ray spectroscopic analysis of materials is described. This pair of instruments will provide imaging NEXAFS analysis of samples in transmission at atmospheric pressure and imaging XPS and NEXAFS analysis of sample surfaces in a UHV environment.</abstract><cop>5 Abbey Square, Chester, Cheshire CH1 2HU, England</cop><pub>International Union of Crystallography</pub><pmid>15263755</pmid><doi>10.1107/S0909049597014283</doi><tpages>3</tpages><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | ISSN: 1600-5775 |
| ispartof | Journal of synchrotron radiation, 1998-05, Vol.5 (3), p.1090-1092 |
| issn | 1600-5775 0909-0495 1600-5775 |
| language | eng |
| recordid | cdi_osti_scitechconnect_794879 |
| source | Wiley Online Library Open Access |
| subjects | ADVANCED LIGHT SOURCE ADVANCED LIGHT SOURCE ALS MICROSCOPES NEXAFS PARTICLE ACCELERATORS spectromicroscopy SYNCHROTRON RADIATION XPS zone plates |
| title | Development of scanning X-ray microscopes for materials science spectromicroscopy at the Advanced Light Source |
| url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-28T13%3A14%3A37IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_24P&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Development%20of%20scanning%20X-ray%20microscopes%20for%20materials%20science%20spectromicroscopy%20at%20the%20Advanced%20Light%20Source&rft.jtitle=Journal%20of%20synchrotron%20radiation&rft.au=Warwick,%20T.&rft.aucorp=Ernest%20Orlando%20Lawrence%20Berkeley%20National%20Lab.,%20Advanced%20Light%20Source,%20Berkeley,%20CA%20(US)&rft.date=1998-05&rft.volume=5&rft.issue=3&rft.spage=1090&rft.epage=1092&rft.pages=1090-1092&rft.issn=1600-5775&rft.eissn=1600-5775&rft_id=info:doi/10.1107/S0909049597014283&rft_dat=%3Cproquest_24P%3E817618465%3C/proquest_24P%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c4542-f12f850dddd3f4f632c985c158e2fa4f63e07e7a6121c67b2edfd57aad70966c3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=817618465&rft_id=info:pmid/15263755&rfr_iscdi=true |