Spectroscopic identification and direct imaging of interfacial magnetic spins

Using x-ray absorption spectromicroscopy we have imaged the uncompensated spins induced at the surface of antiferromagnetic (AFM) NiO(100) by deposition of ferromagnetic (FM) Co. These spins align parallel to the AFM spins in NiO(100) and align the FM spins in Co. The uncompensated interfacial spins...

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Bibliographic Details
Published in:Physical review letters 2001-12, Vol.87 (24), p.247201-247201, Article 247201
Main Authors: Ohldag, H, Regan, T J, Stöhr, J, Scholl, A, Nolting, F, Lüning, J, Stamm, C, Anders, S, White, R L
Format: Article
Language:English
Subjects:
ADVANCED LIGHT SOURCE
LAWRENCE BERKELEY LABORATORY
MATERIALS SCIENCE
PARTICLE ACCELERATORS
SODIUM-MINUS PHOTODETACHMENT ADVANCED LIGHT SOURCE ALS
SPECTROSCOPY
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Summary:Using x-ray absorption spectromicroscopy we have imaged the uncompensated spins induced at the surface of antiferromagnetic (AFM) NiO(100) by deposition of ferromagnetic (FM) Co. These spins align parallel to the AFM spins in NiO(100) and align the FM spins in Co. The uncompensated interfacial spins arise from an ultrathin CoNiOx layer that is formed upon Co deposition through reduction of the NiO surface. The interfacial Ni spins are discussed in terms of the "uncompensated spins" at AFM/FM interfaces long held responsible for coercivity increases and exchange bias. We find a direct correlation between their number and the size of the coercivity.
ISSN:0031-9007
1079-7114
DOI:10.1103/physrevlett.87.247201