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X-ray based sub-picosecond electron bunch characterization using 90{sup o} Thomson scattering

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Bibliographic Details
Published in:	Physical review letters 1996-06, Vol.77 (20)
Main Authors:	Leemans, W.P., Schoenlein, R.W., Volfbeyn, P., Chin, A.H., Glover, T.E., Balling, P., Zolotorev, M., Kim, K.J., Chattopadhyay, S., Shank, C.V.
Format:	Article
Language:	English
Subjects:	ADVANCED LIGHT SOURCE ADVANCED LIGHT SOURCE ALS ELECTRONS PARTICLE ACCELERATORS PHYSICS OF ELEMENTARY PARTICLES AND FIELDS THOMSON SCATTERING
Online Access:	Get full text
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