On the Reciprocity of TEM and STEM

Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

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Bibliographic Details
Published in:Microscopy and microanalysis 2005-08, Vol.11 (S02), p.2114-2115
Main Authors: Rose, H, Kisielowski, C F
Format: Article
Language:English
Subjects:
Aperture
MATERIALS
Materials Research in an Aberration-Free Environment
MATERIALS SCIENCE
MICROANALYSIS
MICROSCOPY
Sensors
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Description
Summary:Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005
ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927605507761