On the Reciprocity of TEM and STEM

Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

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Published in:Microscopy and microanalysis 2005-08, Vol.11 (S02), p.2114-2115
Main Authors: Rose, H, Kisielowski, C F
Format: Article
Language:English
Subjects:
Aperture
MATERIALS
Materials Research in an Aberration-Free Environment
MATERIALS SCIENCE
MICROANALYSIS
MICROSCOPY
Sensors
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container_end_page 2115
container_issue S02
container_start_page 2114
container_title Microscopy and microanalysis
container_volume 11
creator Rose, H
Kisielowski, C F
description Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005
doi_str_mv 10.1017/S1431927605507761
format article
fullrecord <record><control><sourceid>proquest_osti_</sourceid><recordid>TN_cdi_osti_scitechconnect_878706</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><cupid>10_1017_S1431927605507761</cupid><sourcerecordid>1404390481</sourcerecordid><originalsourceid>FETCH-LOGICAL-c2301-9c63ad45a749c86017656efb08fcf5552335ac61fdd939822842c3823f0174cf3</originalsourceid><addsrcrecordid>eNp1kE9PAjEQxRujEUQ_gLfKfbX_2z0aAmqCIRE8N2W2lSWyi-1y4NtbhMSD8TSTmd-b9zII3VJyTwnVD3MqOC2ZVkRKorWiZ6ifR7IwlMrzn54Wh30PXaW0JoRwotUl6jGR5SUTfTScNbhbefzmod7GFupuj9uAF-NX7JoKz3NzjS6C-0z-5lQH6H0yXoyei-ns6WX0OC2AcZJ9QHFXCem0KMGobKCk8mFJTIAgpWScSweKhqoqeWkYM4IBN4yHjAoIfIDujnfb1NU25SgeVtA2jYfOGm00UZkZHpmc9WvnU2fX7S42OZZljHBOpTIZokcIYptS9MFuY71xcW8psYfH2T-Pyxp-0rjNMtbVh_-9_L_qG7mqaJY</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>220331568</pqid></control><display><type>article</type><title>On the Reciprocity of TEM and STEM</title><source>Cambridge Journals Online</source><creator>Rose, H ; Kisielowski, C F</creator><creatorcontrib>Rose, H ; Kisielowski, C F ; Ernest Orlando Lawrence Berkeley NationalLaboratory, Berkeley, CA (US)</creatorcontrib><description>Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005</description><identifier>ISSN: 1431-9276</identifier><identifier>EISSN: 1435-8115</identifier><identifier>DOI: 10.1017/S1431927605507761</identifier><identifier>PMID: 24017924</identifier><language>eng</language><publisher>New York, USA: Cambridge University Press</publisher><subject>Aperture ; MATERIALS ; Materials Research in an Aberration-Free Environment ; MATERIALS SCIENCE ; MICROANALYSIS ; MICROSCOPY ; Sensors</subject><ispartof>Microscopy and microanalysis, 2005-08, Vol.11 (S02), p.2114-2115</ispartof><rights>2005 Microscopy Society of America</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c2301-9c63ad45a749c86017656efb08fcf5552335ac61fdd939822842c3823f0174cf3</citedby></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://www.cambridge.org/core/product/identifier/S1431927605507761/type/journal_article$$EHTML$$P50$$Gcambridge$$H</linktohtml><link.rule.ids>230,314,780,784,885,27924,27925,72960</link.rule.ids><backlink>$$Uhttps://www.osti.gov/biblio/878706$$D View this record in Osti.gov$$Hfree_for_read</backlink></links><search><creatorcontrib>Rose, H</creatorcontrib><creatorcontrib>Kisielowski, C F</creatorcontrib><creatorcontrib>Ernest Orlando Lawrence Berkeley NationalLaboratory, Berkeley, CA (US)</creatorcontrib><title>On the Reciprocity of TEM and STEM</title><title>Microscopy and microanalysis</title><addtitle>Microsc Microanal</addtitle><description>Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005</description><subject>Aperture</subject><subject>MATERIALS</subject><subject>Materials Research in an Aberration-Free Environment</subject><subject>MATERIALS SCIENCE</subject><subject>MICROANALYSIS</subject><subject>MICROSCOPY</subject><subject>Sensors</subject><issn>1431-9276</issn><issn>1435-8115</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2005</creationdate><recordtype>article</recordtype><recordid>eNp1kE9PAjEQxRujEUQ_gLfKfbX_2z0aAmqCIRE8N2W2lSWyi-1y4NtbhMSD8TSTmd-b9zII3VJyTwnVD3MqOC2ZVkRKorWiZ6ifR7IwlMrzn54Wh30PXaW0JoRwotUl6jGR5SUTfTScNbhbefzmod7GFupuj9uAF-NX7JoKz3NzjS6C-0z-5lQH6H0yXoyei-ns6WX0OC2AcZJ9QHFXCem0KMGobKCk8mFJTIAgpWScSweKhqoqeWkYM4IBN4yHjAoIfIDujnfb1NU25SgeVtA2jYfOGm00UZkZHpmc9WvnU2fX7S42OZZljHBOpTIZokcIYptS9MFuY71xcW8psYfH2T-Pyxp-0rjNMtbVh_-9_L_qG7mqaJY</recordid><startdate>20050801</startdate><enddate>20050801</enddate><creator>Rose, H</creator><creator>Kisielowski, C F</creator><general>Cambridge University Press</general><general>Oxford University Press</general><scope>AAYXX</scope><scope>CITATION</scope><scope>3V.</scope><scope>7QO</scope><scope>7RV</scope><scope>7TK</scope><scope>7X7</scope><scope>7XB</scope><scope>88E</scope><scope>8FD</scope><scope>8FE</scope><scope>8FG</scope><scope>8FH</scope><scope>8FI</scope><scope>8FJ</scope><scope>8FK</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>AZQEC</scope><scope>BBNVY</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>BHPHI</scope><scope>CCPQU</scope><scope>DWQXO</scope><scope>FR3</scope><scope>FYUFA</scope><scope>GHDGH</scope><scope>GNUQQ</scope><scope>HCIFZ</scope><scope>K9.</scope><scope>KB0</scope><scope>LK8</scope><scope>M0S</scope><scope>M1P</scope><scope>M7P</scope><scope>NAPCQ</scope><scope>P5Z</scope><scope>P62</scope><scope>P64</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>OTOTI</scope></search><sort><creationdate>20050801</creationdate><title>On the Reciprocity of TEM and STEM</title><author>Rose, H ; Kisielowski, C F</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c2301-9c63ad45a749c86017656efb08fcf5552335ac61fdd939822842c3823f0174cf3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2005</creationdate><topic>Aperture</topic><topic>MATERIALS</topic><topic>Materials Research in an Aberration-Free Environment</topic><topic>MATERIALS SCIENCE</topic><topic>MICROANALYSIS</topic><topic>MICROSCOPY</topic><topic>Sensors</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Rose, H</creatorcontrib><creatorcontrib>Kisielowski, C F</creatorcontrib><creatorcontrib>Ernest Orlando Lawrence Berkeley NationalLaboratory, Berkeley, CA (US)</creatorcontrib><collection>CrossRef</collection><collection>ProQuest Central (Corporate)</collection><collection>Biotechnology Research Abstracts</collection><collection>ProQuest Nursing and Allied Health Journals</collection><collection>Neurosciences Abstracts</collection><collection>Health &amp; Medical Collection</collection><collection>ProQuest Central (purchase pre-March 2016)</collection><collection>Medical Database (Alumni Edition)</collection><collection>Technology Research Database</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>ProQuest Natural Science Collection</collection><collection>Hospital Premium Collection</collection><collection>Hospital Premium Collection (Alumni Edition)</collection><collection>ProQuest Central (Alumni) (purchase pre-March 2016)</collection><collection>ProQuest Central (Alumni)</collection><collection>ProQuest Central</collection><collection>Advanced Technologies &amp; Aerospace Collection</collection><collection>ProQuest Central Essentials</collection><collection>Biological Science Collection</collection><collection>AUTh Library subscriptions: ProQuest Central</collection><collection>Technology Collection</collection><collection>Natural Science Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Central Korea</collection><collection>Engineering Research Database</collection><collection>Health Research Premium Collection</collection><collection>Health Research Premium Collection (Alumni)</collection><collection>ProQuest Central Student</collection><collection>SciTech Premium Collection</collection><collection>ProQuest Health &amp; Medical Complete (Alumni)</collection><collection>Nursing &amp; Allied Health Database (Alumni Edition)</collection><collection>ProQuest Biological Science Collection</collection><collection>Health &amp; Medical Collection (Alumni Edition)</collection><collection>Medical Database</collection><collection>Biological Science Database</collection><collection>Nursing &amp; Allied Health Premium</collection><collection>Advanced Technologies &amp; Aerospace Database</collection><collection>ProQuest Advanced Technologies &amp; Aerospace Collection</collection><collection>Biotechnology and BioEngineering Abstracts</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>OSTI.GOV</collection><jtitle>Microscopy and microanalysis</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Rose, H</au><au>Kisielowski, C F</au><aucorp>Ernest Orlando Lawrence Berkeley NationalLaboratory, Berkeley, CA (US)</aucorp><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>On the Reciprocity of TEM and STEM</atitle><jtitle>Microscopy and microanalysis</jtitle><addtitle>Microsc Microanal</addtitle><date>2005-08-01</date><risdate>2005</risdate><volume>11</volume><issue>S02</issue><spage>2114</spage><epage>2115</epage><pages>2114-2115</pages><issn>1431-9276</issn><eissn>1435-8115</eissn><abstract>Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005</abstract><cop>New York, USA</cop><pub>Cambridge University Press</pub><pmid>24017924</pmid><doi>10.1017/S1431927605507761</doi><tpages>2</tpages><oa>free_for_read</oa></addata></record>
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issn 1431-9276
1435-8115
language eng
recordid cdi_osti_scitechconnect_878706
source Cambridge Journals Online
subjects Aperture
MATERIALS
Materials Research in an Aberration-Free Environment
MATERIALS SCIENCE
MICROANALYSIS
MICROSCOPY
Sensors
title On the Reciprocity of TEM and STEM
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-01T20%3A11%3A46IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_osti_&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=On%20the%20Reciprocity%20of%20TEM%20and%20STEM&rft.jtitle=Microscopy%20and%20microanalysis&rft.au=Rose,%20H&rft.aucorp=Ernest%20Orlando%20Lawrence%20Berkeley%20NationalLaboratory,%20Berkeley,%20CA%20(US)&rft.date=2005-08-01&rft.volume=11&rft.issue=S02&rft.spage=2114&rft.epage=2115&rft.pages=2114-2115&rft.issn=1431-9276&rft.eissn=1435-8115&rft_id=info:doi/10.1017/S1431927605507761&rft_dat=%3Cproquest_osti_%3E1404390481%3C/proquest_osti_%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c2301-9c63ad45a749c86017656efb08fcf5552335ac61fdd939822842c3823f0174cf3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=220331568&rft_id=info:pmid/24017924&rft_cupid=10_1017_S1431927605507761&rfr_iscdi=true