Highly sensitive, single-shot characterization for pulse widths from 0.4 to 85 ps using electro-optic shearing interferometry

Single-shot characterization using electro-optic shearing interferometry (EOSI) is shown for pulse widths ranging from their transform limit (0.4 ps) to 200x their limit (85 ps). In EOSI, the spectral phase is reconstructed by interfering two spectrally sheared replicas of the pulse under test, wher...

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Bibliographic Details
Published in:Optics letters 2006-12, Vol.31 (23), p.3523-3525
Main Authors: BROMAGE, J, DORRER, C, BEGISHEV, I. A, USECHAK, N. G, ZUEGEL, J. D
Format: Article
Language:English
Subjects:
70 PLASMA PHYSICS AND FUSION TECHNOLOGY
ALGORITHMS
ELECTRO-OPTICAL EFFECTS
Exact sciences and technology
Fundamental areas of phenomenology (including applications)
Instruments, apparatus, components and techniques common to several branches of physics and astronomy
Interferometers
INTERFEROMETRY
Nonlinear optics
Optical instruments, equipment and techniques
Optics
Physics
PULSE TECHNIQUES
Ultrafast processes
optical pulse generation and pulse compression
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Summary:Single-shot characterization using electro-optic shearing interferometry (EOSI) is shown for pulse widths ranging from their transform limit (0.4 ps) to 200x their limit (85 ps). In EOSI, the spectral phase is reconstructed by interfering two spectrally sheared replicas of the pulse under test, where the shear is produced by applying linear temporal-phase modulation. We present a new reconstruction algorithm for accurately characterizing chirped pulses, even if the pulse extends beyond the linear region of the phase modulation. Furthermore, since EOSI does not rely on nonlinear optical processes, it requires only 1 nJ pulse energies for all pulse widths, corresponding to a single-shot sensitivity 1000x higher than previously demonstrated.
ISSN:0146-9592
1539-4794
DOI:10.1364/ol.31.003523