Quantitative high-pressure pair distribution function analysis

The collection of scattering data at high pressure and temperature is now relatively straightforward thanks to developments at high‐brightness synchrotron radiation facilities. Reliable data from powders, that are suitable for structure determination and Rietveld refinement, are routinely collected...

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Bibliographic Details
Published in:Journal of synchrotron radiation 2005-09, Vol.12 (5), p.554-559
Main Authors: Parise, John B., Antao, Sytle M., Michel, F. Marc, Martin, C. David, Chupas, Peter J., Shastri, Sarvjit D., Lee, Peter L.
Format: Article
Language:English
Subjects:
advanced photon source
Condensed matter: structure, mechanical and thermal properties
Cross-disciplinary physics: materials science
rheology
DATA ANALYSIS
diamond anvil cell
diffraction
DISTRIBUTION FUNCTIONS
Exact sciences and technology
GENERAL AND MISCELLANEOUS//MATHEMATICS, COMPUTING, AND INFORMATION SCIENCE
high pressure
High-pressure and shock-wave effects in solids and liquids
Materials science
Mechanical and acoustical properties of condensed matter
nano-crystalline materials
Nanocrystalline materials
Nanoscale materials and structures: fabrication and characterization
pair distribution function
perforated diamonds
Physics
PRESSURIZATION
Single-crystal and powder diffraction
Structure of solids and liquids
crystallography
Structure of specific crystalline solids
X-ray diffraction and scattering
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Summary:The collection of scattering data at high pressure and temperature is now relatively straightforward thanks to developments at high‐brightness synchrotron radiation facilities. Reliable data from powders, that are suitable for structure determination and Rietveld refinement, are routinely collected up to about 30 GPa in either a large‐volume high‐pressure apparatus or diamond anvil cell. In those cases where the total elastic scattering is of interest, as it is in the case of nano‐crystalline and glassy materials, technical developments, including the use of focused high‐energy X‐rays (>80 keV), are advantageous. Recently completed experiments on nano‐crystalline materials at the 1‐ID beamline at the Advanced Photon Source suggest that quantitative data, suitable for pair distribution function analysis, can be obtained.
ISSN:1600-5775
0909-0495
1600-5775
DOI:10.1107/S0909049505022612