Structural modification of Ge-Se amorphous films with the addition of Sb

Extended X-ray absorption fine-structure (EXAFS) measurements were undertaken to understand the structural modification of amorphous Ge-Se films that occurs with the addition of Sb. We found that Ge-Ge bonds exist along with Ge-Se bonds in Ge-rich Ge-Se films. These bonds disappear with increasing S...

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Bibliographic Details
Published in:Philosophical magazine letters 2005-10, Vol.85 (10), p.503-512
Main Authors: Ganjoo, A., Jain, H., Khalid, S., Pantano, C. G.
Format: Article
Language:English
Subjects:
ABSORPTION
ANTIMONY
Exact sciences and technology
FINE STRUCTURE
MATERIALS SCIENCE
MODIFICATIONS
national synchrotron light source
NSLS
PARTICLE ACCELERATORS
Physics
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Summary:Extended X-ray absorption fine-structure (EXAFS) measurements were undertaken to understand the structural modification of amorphous Ge-Se films that occurs with the addition of Sb. We found that Ge-Ge bonds exist along with Ge-Se bonds in Ge-rich Ge-Se films. These bonds disappear with increasing Se content, to the extent that Ge-Se bonds predominate in stoichiometric GeSe 2 films. When Ge is replaced by Sb, stable Sb-Se bonds are formed; concurrently, the proportion of Ge-Ge bonds is decreased at the expense of Ge-Se bonds. As a result, GeSbSe glasses have a more stable and stronger network structure.
ISSN:0950-0839
1362-3036
DOI:10.1080/09500830500318841