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Determining thermal diffuse scattering of vanadium with x-ray transmission scattering

In this work, we have proposed a fitting model to evaluate thermal diffuse scattering in the case of high energy incident x ray with Laue transmission scattering, applicable in future studies on samples at high pressure in a diamond anvil cell. We show that the fitting model including a Voigt functi...

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Bibliographic Details
Published in:Applied physics letters 2006-02, Vol.88 (6)
Main Authors: Ding, Yang, Chow, Paul, Mao, Ho-Kwang, Ren, Yang, Prewitt, Charles T.
Format: Article
Language:English
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Summary:In this work, we have proposed a fitting model to evaluate thermal diffuse scattering in the case of high energy incident x ray with Laue transmission scattering, applicable in future studies on samples at high pressure in a diamond anvil cell. We show that the fitting model including a Voigt function and a lattice contribution can account for the measured data. Phonon dispersion curves extracted in this way are consistent with data collected previously by other methods.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.2170142