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Determining thermal diffuse scattering of vanadium with x-ray transmission scattering
In this work, we have proposed a fitting model to evaluate thermal diffuse scattering in the case of high energy incident x ray with Laue transmission scattering, applicable in future studies on samples at high pressure in a diamond anvil cell. We show that the fitting model including a Voigt functi...
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Published in: | Applied physics letters 2006-02, Vol.88 (6) |
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container_title | Applied physics letters |
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creator | Ding, Yang Chow, Paul Mao, Ho-Kwang Ren, Yang Prewitt, Charles T. |
description | In this work, we have proposed a fitting model to evaluate thermal diffuse scattering in the case of high energy incident x ray with Laue transmission scattering, applicable in future studies on samples at high pressure in a diamond anvil cell. We show that the fitting model including a Voigt function and a lattice contribution can account for the measured data. Phonon dispersion curves extracted in this way are consistent with data collected previously by other methods. |
doi_str_mv | 10.1063/1.2170142 |
format | article |
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source | American Institute of Physics:Jisc Collections:Transitional Journals Agreement 2021-23 (Reading list); AIP - American Institute of Physics |
subjects | DIFFUSE SCATTERING INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY PHOTON TRANSMISSION SCANNING THERMODYNAMICS VANADIUM |
title | Determining thermal diffuse scattering of vanadium with x-ray transmission scattering |
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