Loading…
Carrier compensation in semi-insulating CdTe: First-principles calculations
Carrier compensation in semi-insulating CdTe has been attributed to the compensation of surplus shallow acceptors by deep donors, usually assumed to be Te antisites. However, our first-principles calculations show that intrinsic defects should not have a significant effect on the carrier compensatio...
Saved in:
Published in: | Physical review letters 2008-03, Vol.77 (9), Article 094122 |
---|---|
Main Authors: | , , |
Format: | Article |
Language: | English |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
cited_by | cdi_FETCH-LOGICAL-c273t-196594599e7203ffc541ad5ce5d13cc0e1cc80c6f6bf131db67258e28ee2cc153 |
---|---|
cites | cdi_FETCH-LOGICAL-c273t-196594599e7203ffc541ad5ce5d13cc0e1cc80c6f6bf131db67258e28ee2cc153 |
container_end_page | |
container_issue | 9 |
container_start_page | |
container_title | Physical review letters |
container_volume | 77 |
creator | Du, Mao-Hua Takenaka, Hiroyuki Singh, David J. |
description | Carrier compensation in semi-insulating CdTe has been attributed to the compensation of surplus shallow acceptors by deep donors, usually assumed to be Te antisites. However, our first-principles calculations show that intrinsic defects should not have a significant effect on the carrier compensation due either to lack of deep levels near midgap or to low defect concentration. We demonstrate that an extrinsic defect, OTe-H complex, may play an important role in the carrier compensation in CdTe because of its amphoteric character and reasonably high concentration. Our findings have important consequences for improving device performance in CdTe-based radiation detectors and solar cells. |
doi_str_mv | 10.1103/PhysRevB.77.094122 |
format | article |
fullrecord | <record><control><sourceid>crossref_osti_</sourceid><recordid>TN_cdi_osti_scitechconnect_958835</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>10_1103_PhysRevB_77_094122</sourcerecordid><originalsourceid>FETCH-LOGICAL-c273t-196594599e7203ffc541ad5ce5d13cc0e1cc80c6f6bf131db67258e28ee2cc153</originalsourceid><addsrcrecordid>eNo1kNFKwzAUhoMoOKcv4FV9gMycpGka77Q4FQeKTPAudKenLtKlI6mDvb2b06vzc_j4-fkYuwQxARDq-nW5TW-0uZsYMxE2BymP2Ai0Flwq_XG8y8KWXICEU3aW0pcQkNtcjthzVcfoKWbYr9YUUj34PmQ-ZIlWnvuQvrvdK3xmVTOnm2zqYxr4OvqAft1RyrDu8BfpQzpnJ23dJbr4u2P2Pr2fV4989vLwVN3OOEqjBg620DbX1pKRQrUt6hzqRiPpBhSiIEAsBRZtsWhBQbMojNQlyZJIIoJWY3Z16O3T4F1CPxAusQ-BcHBWl6XaM_LAYOxTitS63ehVHbcOhNsrc__KnDHuoEz9AA7qYgs</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Carrier compensation in semi-insulating CdTe: First-principles calculations</title><source>American Physical Society:Jisc Collections:APS Read and Publish 2023-2025 (reading list)</source><creator>Du, Mao-Hua ; Takenaka, Hiroyuki ; Singh, David J.</creator><creatorcontrib>Du, Mao-Hua ; Takenaka, Hiroyuki ; Singh, David J. ; Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)</creatorcontrib><description>Carrier compensation in semi-insulating CdTe has been attributed to the compensation of surplus shallow acceptors by deep donors, usually assumed to be Te antisites. However, our first-principles calculations show that intrinsic defects should not have a significant effect on the carrier compensation due either to lack of deep levels near midgap or to low defect concentration. We demonstrate that an extrinsic defect, OTe-H complex, may play an important role in the carrier compensation in CdTe because of its amphoteric character and reasonably high concentration. Our findings have important consequences for improving device performance in CdTe-based radiation detectors and solar cells.</description><identifier>ISSN: 1098-0121</identifier><identifier>ISSN: 0031-9007</identifier><identifier>EISSN: 1550-235X</identifier><identifier>EISSN: 1079-7114</identifier><identifier>DOI: 10.1103/PhysRevB.77.094122</identifier><language>eng</language><publisher>United States</publisher><ispartof>Physical review letters, 2008-03, Vol.77 (9), Article 094122</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c273t-196594599e7203ffc541ad5ce5d13cc0e1cc80c6f6bf131db67258e28ee2cc153</citedby><cites>FETCH-LOGICAL-c273t-196594599e7203ffc541ad5ce5d13cc0e1cc80c6f6bf131db67258e28ee2cc153</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>230,314,777,781,882,27905,27906</link.rule.ids><backlink>$$Uhttps://www.osti.gov/biblio/958835$$D View this record in Osti.gov$$Hfree_for_read</backlink></links><search><creatorcontrib>Du, Mao-Hua</creatorcontrib><creatorcontrib>Takenaka, Hiroyuki</creatorcontrib><creatorcontrib>Singh, David J.</creatorcontrib><creatorcontrib>Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)</creatorcontrib><title>Carrier compensation in semi-insulating CdTe: First-principles calculations</title><title>Physical review letters</title><description>Carrier compensation in semi-insulating CdTe has been attributed to the compensation of surplus shallow acceptors by deep donors, usually assumed to be Te antisites. However, our first-principles calculations show that intrinsic defects should not have a significant effect on the carrier compensation due either to lack of deep levels near midgap or to low defect concentration. We demonstrate that an extrinsic defect, OTe-H complex, may play an important role in the carrier compensation in CdTe because of its amphoteric character and reasonably high concentration. Our findings have important consequences for improving device performance in CdTe-based radiation detectors and solar cells.</description><issn>1098-0121</issn><issn>0031-9007</issn><issn>1550-235X</issn><issn>1079-7114</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2008</creationdate><recordtype>article</recordtype><recordid>eNo1kNFKwzAUhoMoOKcv4FV9gMycpGka77Q4FQeKTPAudKenLtKlI6mDvb2b06vzc_j4-fkYuwQxARDq-nW5TW-0uZsYMxE2BymP2Ai0Flwq_XG8y8KWXICEU3aW0pcQkNtcjthzVcfoKWbYr9YUUj34PmQ-ZIlWnvuQvrvdK3xmVTOnm2zqYxr4OvqAft1RyrDu8BfpQzpnJ23dJbr4u2P2Pr2fV4989vLwVN3OOEqjBg620DbX1pKRQrUt6hzqRiPpBhSiIEAsBRZtsWhBQbMojNQlyZJIIoJWY3Z16O3T4F1CPxAusQ-BcHBWl6XaM_LAYOxTitS63ehVHbcOhNsrc__KnDHuoEz9AA7qYgs</recordid><startdate>20080301</startdate><enddate>20080301</enddate><creator>Du, Mao-Hua</creator><creator>Takenaka, Hiroyuki</creator><creator>Singh, David J.</creator><scope>AAYXX</scope><scope>CITATION</scope><scope>OTOTI</scope></search><sort><creationdate>20080301</creationdate><title>Carrier compensation in semi-insulating CdTe: First-principles calculations</title><author>Du, Mao-Hua ; Takenaka, Hiroyuki ; Singh, David J.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c273t-196594599e7203ffc541ad5ce5d13cc0e1cc80c6f6bf131db67258e28ee2cc153</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2008</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Du, Mao-Hua</creatorcontrib><creatorcontrib>Takenaka, Hiroyuki</creatorcontrib><creatorcontrib>Singh, David J.</creatorcontrib><creatorcontrib>Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)</creatorcontrib><collection>CrossRef</collection><collection>OSTI.GOV</collection><jtitle>Physical review letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Du, Mao-Hua</au><au>Takenaka, Hiroyuki</au><au>Singh, David J.</au><aucorp>Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)</aucorp><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Carrier compensation in semi-insulating CdTe: First-principles calculations</atitle><jtitle>Physical review letters</jtitle><date>2008-03-01</date><risdate>2008</risdate><volume>77</volume><issue>9</issue><artnum>094122</artnum><issn>1098-0121</issn><issn>0031-9007</issn><eissn>1550-235X</eissn><eissn>1079-7114</eissn><abstract>Carrier compensation in semi-insulating CdTe has been attributed to the compensation of surplus shallow acceptors by deep donors, usually assumed to be Te antisites. However, our first-principles calculations show that intrinsic defects should not have a significant effect on the carrier compensation due either to lack of deep levels near midgap or to low defect concentration. We demonstrate that an extrinsic defect, OTe-H complex, may play an important role in the carrier compensation in CdTe because of its amphoteric character and reasonably high concentration. Our findings have important consequences for improving device performance in CdTe-based radiation detectors and solar cells.</abstract><cop>United States</cop><doi>10.1103/PhysRevB.77.094122</doi></addata></record> |
fulltext | fulltext |
identifier | ISSN: 1098-0121 |
ispartof | Physical review letters, 2008-03, Vol.77 (9), Article 094122 |
issn | 1098-0121 0031-9007 1550-235X 1079-7114 |
language | eng |
recordid | cdi_osti_scitechconnect_958835 |
source | American Physical Society:Jisc Collections:APS Read and Publish 2023-2025 (reading list) |
title | Carrier compensation in semi-insulating CdTe: First-principles calculations |
url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-17T16%3A58%3A59IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-crossref_osti_&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Carrier%20compensation%20in%20semi-insulating%20CdTe:%20First-principles%20calculations&rft.jtitle=Physical%20review%20letters&rft.au=Du,%20Mao-Hua&rft.aucorp=Oak%20Ridge%20National%20Lab.%20(ORNL),%20Oak%20Ridge,%20TN%20(United%20States)&rft.date=2008-03-01&rft.volume=77&rft.issue=9&rft.artnum=094122&rft.issn=1098-0121&rft.eissn=1550-235X&rft_id=info:doi/10.1103/PhysRevB.77.094122&rft_dat=%3Ccrossref_osti_%3E10_1103_PhysRevB_77_094122%3C/crossref_osti_%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c273t-196594599e7203ffc541ad5ce5d13cc0e1cc80c6f6bf131db67258e28ee2cc153%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |