Internal Electric Field Investigations of a Cadmium Zinc Telluride Detector Using Synchrotron X-ray Mapping and Pockels Effect Measurements

Cadmium zinc telluride (CZT) has remained a major focus of research due to its promising application as a room-temperature nuclear radiation detector material. Among the several parameters that substantially affect the detectors’ performance, an important one is the distribution of the internal elec...

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Bibliographic Details
Published in:Journal of electronic materials 2009-08, Vol.38 (8), p.1563-1567
Main Authors: Yang, G., Bolotnikov, A. E., Camarda, G. S., Cui, Y., Hossain, A., Yao, H. W., James, R. B.
Format: Article
Language:English
Subjects:
BNL
CADMIUM
Cadmium zinc telluride
Characterization and Evaluation of Materials
Chemistry and Materials Science
Condensed matter: structure, mechanical and thermal properties
DEFECTS
Defects and impurities in crystals
microstructure
DISLOCATIONS
DISTRIBUTION
ELECTRIC FIELDS
Electronics and Microelectronics
Exact sciences and technology
Instrumentation
INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
Linear defects: dislocations, disclinations
Mapping
Materials Science
national synchrotron light source
Optical and Electronic Materials
PARTICLE ACCELERATORS
Physics
RADIATION DETECTORS
Solid State Physics
Structure of solids and liquids
crystallography
SYNCHROTRONS
Temperature
TRAPPING
ZINC TELLURIDES
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Summary:Cadmium zinc telluride (CZT) has remained a major focus of research due to its promising application as a room-temperature nuclear radiation detector material. Among the several parameters that substantially affect the detectors’ performance, an important one is the distribution of the internal electric field. Brookhaven National Laboratory (BNL) employed synchrotron x-ray microscale mapping and measurements of the Pockels effect to investigate the distribution of the internal electric field in a CZT strip detector. Direct evidence that dislocations can distort the internal electric field of the detector was obtained. Furthermore, it was found that “star” defects in the CZT crystal, possibly ascribed to dislocation loop punching, cause charge trapping.
ISSN:0361-5235
1543-186X
DOI:10.1007/s11664-009-0799-y