Internal Electric Field Investigations of a Cadmium Zinc Telluride Detector Using Synchrotron X-ray Mapping and Pockels Effect Measurements

Cadmium zinc telluride (CZT) has remained a major focus of research due to its promising application as a room-temperature nuclear radiation detector material. Among the several parameters that substantially affect the detectors’ performance, an important one is the distribution of the internal elec...

Full description

Saved in:
Bibliographic Details
Published in:Journal of electronic materials 2009-08, Vol.38 (8), p.1563-1567
Main Authors: Yang, G., Bolotnikov, A. E., Camarda, G. S., Cui, Y., Hossain, A., Yao, H. W., James, R. B.
Format: Article
Language:English
Subjects:
BNL
CADMIUM
Cadmium zinc telluride
Characterization and Evaluation of Materials
Chemistry and Materials Science
Condensed matter: structure, mechanical and thermal properties
DEFECTS
Defects and impurities in crystals
microstructure
DISLOCATIONS
DISTRIBUTION
ELECTRIC FIELDS
Electronics and Microelectronics
Exact sciences and technology
Instrumentation
INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
Linear defects: dislocations, disclinations
Mapping
Materials Science
national synchrotron light source
Optical and Electronic Materials
PARTICLE ACCELERATORS
Physics
RADIATION DETECTORS
Solid State Physics
Structure of solids and liquids
crystallography
SYNCHROTRONS
Temperature
TRAPPING
ZINC TELLURIDES
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
cited_by cdi_FETCH-LOGICAL-c371t-8d080c89ecb7d582079941d0590d0066f8c54ba9cc27a439f7dd70c25f80d97a3
cites cdi_FETCH-LOGICAL-c371t-8d080c89ecb7d582079941d0590d0066f8c54ba9cc27a439f7dd70c25f80d97a3
container_end_page 1567
container_issue 8
container_start_page 1563
container_title Journal of electronic materials
container_volume 38
creator Yang, G.
Bolotnikov, A. E.
Camarda, G. S.
Cui, Y.
Hossain, A.
Yao, H. W.
James, R. B.
description Cadmium zinc telluride (CZT) has remained a major focus of research due to its promising application as a room-temperature nuclear radiation detector material. Among the several parameters that substantially affect the detectors’ performance, an important one is the distribution of the internal electric field. Brookhaven National Laboratory (BNL) employed synchrotron x-ray microscale mapping and measurements of the Pockels effect to investigate the distribution of the internal electric field in a CZT strip detector. Direct evidence that dislocations can distort the internal electric field of the detector was obtained. Furthermore, it was found that “star” defects in the CZT crystal, possibly ascribed to dislocation loop punching, cause charge trapping.
doi_str_mv 10.1007/s11664-009-0799-y
format article
fullrecord <record><control><sourceid>proquest_osti_</sourceid><recordid>TN_cdi_osti_scitechconnect_980284</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2059325081</sourcerecordid><originalsourceid>FETCH-LOGICAL-c371t-8d080c89ecb7d582079941d0590d0066f8c54ba9cc27a439f7dd70c25f80d97a3</originalsourceid><addsrcrecordid>eNp1kc1u1DAUhS0EEkPhAdgZJJaGaydO7CUapmWkViDRShUby_XP1CVjD3aClGfgpXGUClas7uJ-5-jcexB6TeE9Beg_FEq7riUAkkAvJZmfoA3lbUOo6G6fog00HSWcNfw5elHKAwDlVNAN-r2Po8tRD3g3ODPmYPB5cIPF-_jLlTEc9BhSLDh5rPFW22OYjvh7iAZfu2GYcrAOf3JjlaaMb0qIB_xtjuY-pzGniG9J1jO-0qfTstHR4q_J_HBDwTvvqwhfOV2m7I4ujuUleub1UNyrx3mGbs5319vP5PLLxX778ZKYpqcjERYEGCGduestF2y5t6UWuAQL0HVeGN7eaWkM63XbSN9b24Nh3AuwstfNGXqz-qZ6oCom1Pj3JsVYAykpgIm2Mm9X5pTTz6l-Qj2kaflTUa2UlDPWiQrRFTI5lZKdV6ccjjrPioJaalFrLarWopaYaq6ad4_Guhg9-KyjCeWvkLGm5bLhlWMrV-oqHlz-F-D_5n8A1N6epg</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>499152268</pqid></control><display><type>article</type><title>Internal Electric Field Investigations of a Cadmium Zinc Telluride Detector Using Synchrotron X-ray Mapping and Pockels Effect Measurements</title><source>Springer Nature</source><creator>Yang, G. ; Bolotnikov, A. E. ; Camarda, G. S. ; Cui, Y. ; Hossain, A. ; Yao, H. W. ; James, R. B.</creator><creatorcontrib>Yang, G. ; Bolotnikov, A. E. ; Camarda, G. S. ; Cui, Y. ; Hossain, A. ; Yao, H. W. ; James, R. B. ; Brookhaven National Laboratory (BNL) National Synchrotron Light Source</creatorcontrib><description>Cadmium zinc telluride (CZT) has remained a major focus of research due to its promising application as a room-temperature nuclear radiation detector material. Among the several parameters that substantially affect the detectors’ performance, an important one is the distribution of the internal electric field. Brookhaven National Laboratory (BNL) employed synchrotron x-ray microscale mapping and measurements of the Pockels effect to investigate the distribution of the internal electric field in a CZT strip detector. Direct evidence that dislocations can distort the internal electric field of the detector was obtained. Furthermore, it was found that “star” defects in the CZT crystal, possibly ascribed to dislocation loop punching, cause charge trapping.</description><identifier>ISSN: 0361-5235</identifier><identifier>EISSN: 1543-186X</identifier><identifier>DOI: 10.1007/s11664-009-0799-y</identifier><identifier>CODEN: JECMA5</identifier><language>eng</language><publisher>Boston: Springer US</publisher><subject>BNL ; CADMIUM ; Cadmium zinc telluride ; Characterization and Evaluation of Materials ; Chemistry and Materials Science ; Condensed matter: structure, mechanical and thermal properties ; DEFECTS ; Defects and impurities in crystals; microstructure ; DISLOCATIONS ; DISTRIBUTION ; ELECTRIC FIELDS ; Electronics and Microelectronics ; Exact sciences and technology ; Instrumentation ; INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY ; Linear defects: dislocations, disclinations ; Mapping ; Materials Science ; national synchrotron light source ; Optical and Electronic Materials ; PARTICLE ACCELERATORS ; Physics ; RADIATION DETECTORS ; Solid State Physics ; Structure of solids and liquids; crystallography ; SYNCHROTRONS ; Temperature ; TRAPPING ; ZINC TELLURIDES</subject><ispartof>Journal of electronic materials, 2009-08, Vol.38 (8), p.1563-1567</ispartof><rights>TMS 2009</rights><rights>2015 INIST-CNRS</rights><rights>Copyright Minerals, Metals &amp; Materials Society Aug 2009</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c371t-8d080c89ecb7d582079941d0590d0066f8c54ba9cc27a439f7dd70c25f80d97a3</citedby><cites>FETCH-LOGICAL-c371t-8d080c89ecb7d582079941d0590d0066f8c54ba9cc27a439f7dd70c25f80d97a3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>230,309,310,314,780,784,789,790,885,23928,23929,25138,27922,27923</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&amp;idt=22345935$$DView record in Pascal Francis$$Hfree_for_read</backlink><backlink>$$Uhttps://www.osti.gov/biblio/980284$$D View this record in Osti.gov$$Hfree_for_read</backlink></links><search><creatorcontrib>Yang, G.</creatorcontrib><creatorcontrib>Bolotnikov, A. E.</creatorcontrib><creatorcontrib>Camarda, G. S.</creatorcontrib><creatorcontrib>Cui, Y.</creatorcontrib><creatorcontrib>Hossain, A.</creatorcontrib><creatorcontrib>Yao, H. W.</creatorcontrib><creatorcontrib>James, R. B.</creatorcontrib><creatorcontrib>Brookhaven National Laboratory (BNL) National Synchrotron Light Source</creatorcontrib><title>Internal Electric Field Investigations of a Cadmium Zinc Telluride Detector Using Synchrotron X-ray Mapping and Pockels Effect Measurements</title><title>Journal of electronic materials</title><addtitle>Journal of Elec Materi</addtitle><description>Cadmium zinc telluride (CZT) has remained a major focus of research due to its promising application as a room-temperature nuclear radiation detector material. Among the several parameters that substantially affect the detectors’ performance, an important one is the distribution of the internal electric field. Brookhaven National Laboratory (BNL) employed synchrotron x-ray microscale mapping and measurements of the Pockels effect to investigate the distribution of the internal electric field in a CZT strip detector. Direct evidence that dislocations can distort the internal electric field of the detector was obtained. Furthermore, it was found that “star” defects in the CZT crystal, possibly ascribed to dislocation loop punching, cause charge trapping.</description><subject>BNL</subject><subject>CADMIUM</subject><subject>Cadmium zinc telluride</subject><subject>Characterization and Evaluation of Materials</subject><subject>Chemistry and Materials Science</subject><subject>Condensed matter: structure, mechanical and thermal properties</subject><subject>DEFECTS</subject><subject>Defects and impurities in crystals; microstructure</subject><subject>DISLOCATIONS</subject><subject>DISTRIBUTION</subject><subject>ELECTRIC FIELDS</subject><subject>Electronics and Microelectronics</subject><subject>Exact sciences and technology</subject><subject>Instrumentation</subject><subject>INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY</subject><subject>Linear defects: dislocations, disclinations</subject><subject>Mapping</subject><subject>Materials Science</subject><subject>national synchrotron light source</subject><subject>Optical and Electronic Materials</subject><subject>PARTICLE ACCELERATORS</subject><subject>Physics</subject><subject>RADIATION DETECTORS</subject><subject>Solid State Physics</subject><subject>Structure of solids and liquids; crystallography</subject><subject>SYNCHROTRONS</subject><subject>Temperature</subject><subject>TRAPPING</subject><subject>ZINC TELLURIDES</subject><issn>0361-5235</issn><issn>1543-186X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2009</creationdate><recordtype>article</recordtype><recordid>eNp1kc1u1DAUhS0EEkPhAdgZJJaGaydO7CUapmWkViDRShUby_XP1CVjD3aClGfgpXGUClas7uJ-5-jcexB6TeE9Beg_FEq7riUAkkAvJZmfoA3lbUOo6G6fog00HSWcNfw5elHKAwDlVNAN-r2Po8tRD3g3ODPmYPB5cIPF-_jLlTEc9BhSLDh5rPFW22OYjvh7iAZfu2GYcrAOf3JjlaaMb0qIB_xtjuY-pzGniG9J1jO-0qfTstHR4q_J_HBDwTvvqwhfOV2m7I4ujuUleub1UNyrx3mGbs5319vP5PLLxX778ZKYpqcjERYEGCGduestF2y5t6UWuAQL0HVeGN7eaWkM63XbSN9b24Nh3AuwstfNGXqz-qZ6oCom1Pj3JsVYAykpgIm2Mm9X5pTTz6l-Qj2kaflTUa2UlDPWiQrRFTI5lZKdV6ccjjrPioJaalFrLarWopaYaq6ad4_Guhg9-KyjCeWvkLGm5bLhlWMrV-oqHlz-F-D_5n8A1N6epg</recordid><startdate>20090801</startdate><enddate>20090801</enddate><creator>Yang, G.</creator><creator>Bolotnikov, A. E.</creator><creator>Camarda, G. S.</creator><creator>Cui, Y.</creator><creator>Hossain, A.</creator><creator>Yao, H. W.</creator><creator>James, R. B.</creator><general>Springer US</general><general>Springer</general><general>Springer Nature B.V</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>3V.</scope><scope>7XB</scope><scope>88I</scope><scope>8AF</scope><scope>8AO</scope><scope>8FE</scope><scope>8FG</scope><scope>8FK</scope><scope>8G5</scope><scope>ABJCF</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>AZQEC</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>D1I</scope><scope>DWQXO</scope><scope>GNUQQ</scope><scope>GUQSH</scope><scope>HCIFZ</scope><scope>KB.</scope><scope>L6V</scope><scope>M2O</scope><scope>M2P</scope><scope>M7S</scope><scope>MBDVC</scope><scope>P5Z</scope><scope>P62</scope><scope>PDBOC</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope><scope>PTHSS</scope><scope>Q9U</scope><scope>S0X</scope><scope>OTOTI</scope></search><sort><creationdate>20090801</creationdate><title>Internal Electric Field Investigations of a Cadmium Zinc Telluride Detector Using Synchrotron X-ray Mapping and Pockels Effect Measurements</title><author>Yang, G. ; Bolotnikov, A. E. ; Camarda, G. S. ; Cui, Y. ; Hossain, A. ; Yao, H. W. ; James, R. B.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c371t-8d080c89ecb7d582079941d0590d0066f8c54ba9cc27a439f7dd70c25f80d97a3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2009</creationdate><topic>BNL</topic><topic>CADMIUM</topic><topic>Cadmium zinc telluride</topic><topic>Characterization and Evaluation of Materials</topic><topic>Chemistry and Materials Science</topic><topic>Condensed matter: structure, mechanical and thermal properties</topic><topic>DEFECTS</topic><topic>Defects and impurities in crystals; microstructure</topic><topic>DISLOCATIONS</topic><topic>DISTRIBUTION</topic><topic>ELECTRIC FIELDS</topic><topic>Electronics and Microelectronics</topic><topic>Exact sciences and technology</topic><topic>Instrumentation</topic><topic>INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY</topic><topic>Linear defects: dislocations, disclinations</topic><topic>Mapping</topic><topic>Materials Science</topic><topic>national synchrotron light source</topic><topic>Optical and Electronic Materials</topic><topic>PARTICLE ACCELERATORS</topic><topic>Physics</topic><topic>RADIATION DETECTORS</topic><topic>Solid State Physics</topic><topic>Structure of solids and liquids; crystallography</topic><topic>SYNCHROTRONS</topic><topic>Temperature</topic><topic>TRAPPING</topic><topic>ZINC TELLURIDES</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Yang, G.</creatorcontrib><creatorcontrib>Bolotnikov, A. E.</creatorcontrib><creatorcontrib>Camarda, G. S.</creatorcontrib><creatorcontrib>Cui, Y.</creatorcontrib><creatorcontrib>Hossain, A.</creatorcontrib><creatorcontrib>Yao, H. W.</creatorcontrib><creatorcontrib>James, R. B.</creatorcontrib><creatorcontrib>Brookhaven National Laboratory (BNL) National Synchrotron Light Source</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>ProQuest Central (Corporate)</collection><collection>ProQuest Central (purchase pre-March 2016)</collection><collection>Science Database (Alumni Edition)</collection><collection>STEM Database</collection><collection>ProQuest Pharma Collection</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>ProQuest Central (Alumni) (purchase pre-March 2016)</collection><collection>Research Library (Alumni Edition)</collection><collection>Materials Science &amp; Engineering Collection</collection><collection>ProQuest Central (Alumni)</collection><collection>ProQuest Central</collection><collection>Advanced Technologies &amp; Aerospace Collection</collection><collection>ProQuest Central Essentials</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Materials Science Collection</collection><collection>ProQuest Central Korea</collection><collection>ProQuest Central Student</collection><collection>Research Library Prep</collection><collection>SciTech Premium Collection</collection><collection>Materials Science Database</collection><collection>ProQuest Engineering Collection</collection><collection>Research Library</collection><collection>ProQuest Science Journals</collection><collection>Engineering Database</collection><collection>Research Library (Corporate)</collection><collection>Advanced Technologies &amp; Aerospace Database</collection><collection>ProQuest Advanced Technologies &amp; Aerospace Collection</collection><collection>Materials Science Collection</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><collection>Engineering Collection</collection><collection>ProQuest Central Basic</collection><collection>SIRS Editorial</collection><collection>OSTI.GOV</collection><jtitle>Journal of electronic materials</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Yang, G.</au><au>Bolotnikov, A. E.</au><au>Camarda, G. S.</au><au>Cui, Y.</au><au>Hossain, A.</au><au>Yao, H. W.</au><au>James, R. B.</au><aucorp>Brookhaven National Laboratory (BNL) National Synchrotron Light Source</aucorp><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Internal Electric Field Investigations of a Cadmium Zinc Telluride Detector Using Synchrotron X-ray Mapping and Pockels Effect Measurements</atitle><jtitle>Journal of electronic materials</jtitle><stitle>Journal of Elec Materi</stitle><date>2009-08-01</date><risdate>2009</risdate><volume>38</volume><issue>8</issue><spage>1563</spage><epage>1567</epage><pages>1563-1567</pages><issn>0361-5235</issn><eissn>1543-186X</eissn><coden>JECMA5</coden><abstract>Cadmium zinc telluride (CZT) has remained a major focus of research due to its promising application as a room-temperature nuclear radiation detector material. Among the several parameters that substantially affect the detectors’ performance, an important one is the distribution of the internal electric field. Brookhaven National Laboratory (BNL) employed synchrotron x-ray microscale mapping and measurements of the Pockels effect to investigate the distribution of the internal electric field in a CZT strip detector. Direct evidence that dislocations can distort the internal electric field of the detector was obtained. Furthermore, it was found that “star” defects in the CZT crystal, possibly ascribed to dislocation loop punching, cause charge trapping.</abstract><cop>Boston</cop><pub>Springer US</pub><doi>10.1007/s11664-009-0799-y</doi><tpages>5</tpages></addata></record>
fulltext fulltext
identifier ISSN: 0361-5235
ispartof Journal of electronic materials, 2009-08, Vol.38 (8), p.1563-1567
issn 0361-5235
1543-186X
language eng
recordid cdi_osti_scitechconnect_980284
source Springer Nature
subjects BNL
CADMIUM
Cadmium zinc telluride
Characterization and Evaluation of Materials
Chemistry and Materials Science
Condensed matter: structure, mechanical and thermal properties
DEFECTS
Defects and impurities in crystals
microstructure
DISLOCATIONS
DISTRIBUTION
ELECTRIC FIELDS
Electronics and Microelectronics
Exact sciences and technology
Instrumentation
INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
Linear defects: dislocations, disclinations
Mapping
Materials Science
national synchrotron light source
Optical and Electronic Materials
PARTICLE ACCELERATORS
Physics
RADIATION DETECTORS
Solid State Physics
Structure of solids and liquids
crystallography
SYNCHROTRONS
Temperature
TRAPPING
ZINC TELLURIDES
title Internal Electric Field Investigations of a Cadmium Zinc Telluride Detector Using Synchrotron X-ray Mapping and Pockels Effect Measurements
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-09T17%3A17%3A19IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_osti_&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Internal%20Electric%20Field%20Investigations%20of%20a%20Cadmium%20Zinc%20Telluride%20Detector%20Using%20Synchrotron%20X-ray%20Mapping%20and%20Pockels%20Effect%20Measurements&rft.jtitle=Journal%20of%20electronic%20materials&rft.au=Yang,%20G.&rft.aucorp=Brookhaven%20National%20Laboratory%20(BNL)%20National%20Synchrotron%20Light%20Source&rft.date=2009-08-01&rft.volume=38&rft.issue=8&rft.spage=1563&rft.epage=1567&rft.pages=1563-1567&rft.issn=0361-5235&rft.eissn=1543-186X&rft.coden=JECMA5&rft_id=info:doi/10.1007/s11664-009-0799-y&rft_dat=%3Cproquest_osti_%3E2059325081%3C/proquest_osti_%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c371t-8d080c89ecb7d582079941d0590d0066f8c54ba9cc27a439f7dd70c25f80d97a3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=499152268&rft_id=info:pmid/&rfr_iscdi=true