Simple Tools for Characterization of Synchrotron Beam Flux, Energy Resolution and Stability

Flux is a simple yet key indicator of overall beamline alignment For many synchrotron measurements, the energy resolution and reproducibility are important characteristics as well. However, many beamlines do not have difrractometers capable of measuring the energy resolution in the experimental hutc...

Full description

Saved in:
Bibliographic Details
Published in:AIP conference proceedings 2009-10, Vol.1234 (1), p.645-648
Main Authors: Dvorak, Joseph, Berman, Lonny, Hulbert, Steven L, Peter Siddons, D, Wallwork, Kia
Format: Article
Language:English
Subjects:
ALIGNMENT
Beams (structural)
Calibration
Detectors
DIFFRACTOMETERS
ENERGY RESOLUTION
Flux
Handling
Indicators
Materials handling
Measuring instruments
Monochromators
OTHER INSTRUMENTATION
PARTICLE ACCELERATORS
PHOTODIODES
Portability
RADIATIONS
Reproducibility
Scanning
Silicon
STABILITY
synchrotron beamline characterization
synchrotron radiation
SYNCHROTRONS
THICKNESS
X-ray apparatus
X-ray monochromators
X-rays
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:Flux is a simple yet key indicator of overall beamline alignment For many synchrotron measurements, the energy resolution and reproducibility are important characteristics as well. However, many beamlines do not have difrractometers capable of measuring the energy resolution in the experimental hutches. For absolute flux measurements, we have found that thickness calibrated Si photodiodes make very convenient, robust detectors capable of handling a wide flux range. For measuring the energy resolution, we have developed a simple, portable instrument analyzer applicable to any beamline with a scanning monochromator. This same instrument is capable of measuring the energy stability and reproducibility as well. We have used these to characterize many of the beamlines on the NSLS X-ray ring, and will present the methods and our experience to date to demonstrate their usefulness.
ISSN:0094-243X
1551-7616