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CeNixOy and CeAlzNixOysolids studied by electron microscopy, XRD, XPS and depth sputtering techniques

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Bibliographic Details
Published in:Physical chemistry chemical physics : PCCP 2000, Vol.2 (2), p.303-312
Main Authors: PONCHEL, A, D'HUYSSER, A, LAMONIER, C, JALOWIECKI-DUHAMEL, L
Format: Article
Language:English
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ISSN:1463-9076
1463-9084