Lattice defects in nanocrystalline CeO2 thin films

The results of Raman scattering studies of nanocrystalline CeO 2 thin films are presented. The spectra have been described using the spatial correlation model from which the coherence length has been determined as a function of grain size. A direct comparison between the concentration of defects rel...

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Bibliographic Details
Published in:Radiation effects and defects in solids 2001-01, Vol.156 (1-4), p.109-115
Main Authors: Kosacki, I., Suzuki, T., Petrovsky, V., Anderson, H. U., Colomban, P.
Format: Article
Language:English
Subjects:
Ceria
Condensed matter: structure, mechanical and thermal properties
Defects and impurities: doping, implantation, distribution, concentration, etc
Exact sciences and technology
Nanomaterials
Nonstoichiometry
Physics
Raman scattering
Surfaces and interfaces
thin films and whiskers (structure and nonelectronic properties)
Thin film structure and morphology
Thin films
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Summary:The results of Raman scattering studies of nanocrystalline CeO 2 thin films are presented. The spectra have been described using the spatial correlation model from which the coherence length has been determined as a function of grain size. A direct comparison between the concentration of defects related to coherence length and microstructure of CeO 2 has been achieved.
ISSN:1042-0150
1029-4953
DOI:10.1080/10420150108216880