Observation of Si(1 0 0) surface with noncontact atomic force microscope at 5 K

We observed atomic resolution images of the Si(1 0 0) surface at 5 K using low-temperature noncontact atomic force microscope (LT-NC-AFM). Si(1 0 0) surface shows almost the asymmetric dimers structure, except for the symmetric dimers structure near the defects. The asymmetric dimers are mainly c(4×...

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Bibliographic Details
Published in:Applied surface science 2002-03, Vol.188 (3), p.279-284
Main Authors: Uozumi, T., Tomiyoshi, Y., Suehira, N., Sugawara, Y., Morita, S.
Format: Article
Language:English
Subjects:
Condensed matter: structure, mechanical and thermal properties
Exact sciences and technology
Frequency modulation technique
Low temperature atomic force microscope
Noncontact atomic force microscope
Physics
Solid surfaces and solid-solid interfaces
Surface structure and topography
Surfaces and interfaces
thin films and whiskers (structure and nonelectronic properties)
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Summary:We observed atomic resolution images of the Si(1 0 0) surface at 5 K using low-temperature noncontact atomic force microscope (LT-NC-AFM). Si(1 0 0) surface shows almost the asymmetric dimers structure, except for the symmetric dimers structure near the defects. The asymmetric dimers are mainly c(4×2) structure with antiparallel zigzag pattern and partly p(2×2) structure with parallel zigzag pattern.
ISSN:0169-4332
1873-5584
DOI:10.1016/S0169-4332(01)00939-4