Loading…

Atom manipulation and image artifact on Si(111)7 x 7 surface using a low temperature noncontact atomic force microscope

Saved in:

Bibliographic Details
Main Authors:	SUGAWARA, Y, SANO, Y, SUEHIRA, N, MORITA, S
Format:	Conference Proceeding
Language:	English
Subjects:	Condensed matter: structure, mechanical and thermal properties Electron, ion, and scanning probe microscopy Exact sciences and technology Physics Scanning probe microscopy: scanning tunneling, atomic force, scanning optical, magnetic force, etc Structure of solids and liquids crystallography
Online Access:	Get full text
Tags:	Add Tag No Tags, Be the first to tag this record!