Loading…
Standardized Q-statistic for improved sensitivity in the monitoring of residuals in MSPC
This paper presents the standardized Q‐statistic for monitoring residuals of latent variable models in multivariate statistical process control (MSPC). Before the summation of the squared residuals, they are scaled according to their expected variation obtained from normal operating conditions (NOC)...
Saved in:
Published in: | Journal of chemometrics 2000-07, Vol.14 (4), p.335-349 |
---|---|
Main Authors: | , , |
Format: | Article |
Language: | English |
Subjects: | |
Online Access: | Get full text |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
cited_by | |
---|---|
cites | |
container_end_page | 349 |
container_issue | 4 |
container_start_page | 335 |
container_title | Journal of chemometrics |
container_volume | 14 |
creator | Westerhuis, Johan A. Gurden, Stephen P. Smilde, Age K. |
description | This paper presents the standardized Q‐statistic for monitoring residuals of latent variable models in multivariate statistical process control (MSPC). Before the summation of the squared residuals, they are scaled according to their expected variation obtained from normal operating conditions (NOC) data. Data from a simulated batch process and from an industrial batch process are used to show that this scaling improves the sensitivity of the Q‐statistic considerably. The standardized Q‐statistic is introduced for the off‐line monitoring of batch processes, but it can also be used for the monitoring of continuous processes as well as for the on‐line monitoring of batch processes. Copyright © 2000 John Wiley & Sons, Ltd. |
doi_str_mv | 10.1002/1099-128X(200007/08)14:4<335::AID-CEM579>3.0.CO;2-F |
format | article |
fullrecord | <record><control><sourceid>wiley_pasca</sourceid><recordid>TN_cdi_pascalfrancis_primary_1409603</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CEM579</sourcerecordid><originalsourceid>FETCH-LOGICAL-i2999-1bba5f3bb4a83272236a705b7ab343de537d570427fcca7264240b6e4bd664853</originalsourceid><addsrcrecordid>eNpFkE1P3DAQhq2qSN0C_yGHHtpDFsfjryxVJRTYBQm6raDtqpeRkzity26yssPH8utxFETnYo3fmUejh5DjjE4zStlRRvM8zZhefWQ0ljqi-lPGZ_wzgJjNTi5O0-LsSqj8C0zptFges3T-hkxet96SCdVapjloeEfeh_AvQvIc-ISsrnvT1sbX7snWyfc09KZ3oXdV0nQ-cZut7-5jEGwbXO_uXb9LXJv0f22y6VrXd961f5KuSbwNrr4z6zDEV9ffigOy18TWHr68--TH_OymOE8vl4uL4uQydSwfzitLIxooS240MMUYSKOoKJUpgUNtBahaKMqZaqrKKCY547SUlpe1lFwL2CcfRu7WhMqsG2_aygXcercxfocZp7mkEMd-jmMPbm13_2OKg2AcVOGgCkfBSHVcRY5RMEa_OPpFQIrFEhnOX34iOB3B0Zp9fAUbf4tSgRL46-sC5er3Si2Exht4BukBhHk</addsrcrecordid><sourcetype>Index Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Standardized Q-statistic for improved sensitivity in the monitoring of residuals in MSPC</title><source>Wiley</source><creator>Westerhuis, Johan A. ; Gurden, Stephen P. ; Smilde, Age K.</creator><creatorcontrib>Westerhuis, Johan A. ; Gurden, Stephen P. ; Smilde, Age K.</creatorcontrib><description>This paper presents the standardized Q‐statistic for monitoring residuals of latent variable models in multivariate statistical process control (MSPC). Before the summation of the squared residuals, they are scaled according to their expected variation obtained from normal operating conditions (NOC) data. Data from a simulated batch process and from an industrial batch process are used to show that this scaling improves the sensitivity of the Q‐statistic considerably. The standardized Q‐statistic is introduced for the off‐line monitoring of batch processes, but it can also be used for the monitoring of continuous processes as well as for the on‐line monitoring of batch processes. Copyright © 2000 John Wiley & Sons, Ltd.</description><identifier>ISSN: 0886-9383</identifier><identifier>EISSN: 1099-128X</identifier><identifier>DOI: 10.1002/1099-128X(200007/08)14:4<335::AID-CEM579>3.0.CO;2-F</identifier><identifier>CODEN: JOCHEU</identifier><language>eng</language><publisher>Chichester, UK: John Wiley & Sons, Ltd</publisher><subject>Chemistry ; Exact sciences and technology ; fault detection ; General and physical chemistry ; General. Nomenclature, chemical documentation, computer chemistry ; process monitoring ; Q-statistic ; Theory of reactions, general kinetics. Catalysis. Nomenclature, chemical documentation, computer chemistry</subject><ispartof>Journal of chemometrics, 2000-07, Vol.14 (4), p.335-349</ispartof><rights>Copyright © 2000 John Wiley & Sons, Ltd.</rights><rights>2000 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27923,27924</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=1409603$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Westerhuis, Johan A.</creatorcontrib><creatorcontrib>Gurden, Stephen P.</creatorcontrib><creatorcontrib>Smilde, Age K.</creatorcontrib><title>Standardized Q-statistic for improved sensitivity in the monitoring of residuals in MSPC</title><title>Journal of chemometrics</title><addtitle>J. Chemometrics</addtitle><description>This paper presents the standardized Q‐statistic for monitoring residuals of latent variable models in multivariate statistical process control (MSPC). Before the summation of the squared residuals, they are scaled according to their expected variation obtained from normal operating conditions (NOC) data. Data from a simulated batch process and from an industrial batch process are used to show that this scaling improves the sensitivity of the Q‐statistic considerably. The standardized Q‐statistic is introduced for the off‐line monitoring of batch processes, but it can also be used for the monitoring of continuous processes as well as for the on‐line monitoring of batch processes. Copyright © 2000 John Wiley & Sons, Ltd.</description><subject>Chemistry</subject><subject>Exact sciences and technology</subject><subject>fault detection</subject><subject>General and physical chemistry</subject><subject>General. Nomenclature, chemical documentation, computer chemistry</subject><subject>process monitoring</subject><subject>Q-statistic</subject><subject>Theory of reactions, general kinetics. Catalysis. Nomenclature, chemical documentation, computer chemistry</subject><issn>0886-9383</issn><issn>1099-128X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2000</creationdate><recordtype>article</recordtype><recordid>eNpFkE1P3DAQhq2qSN0C_yGHHtpDFsfjryxVJRTYBQm6raDtqpeRkzity26yssPH8utxFETnYo3fmUejh5DjjE4zStlRRvM8zZhefWQ0ljqi-lPGZ_wzgJjNTi5O0-LsSqj8C0zptFges3T-hkxet96SCdVapjloeEfeh_AvQvIc-ISsrnvT1sbX7snWyfc09KZ3oXdV0nQ-cZut7-5jEGwbXO_uXb9LXJv0f22y6VrXd961f5KuSbwNrr4z6zDEV9ffigOy18TWHr68--TH_OymOE8vl4uL4uQydSwfzitLIxooS240MMUYSKOoKJUpgUNtBahaKMqZaqrKKCY547SUlpe1lFwL2CcfRu7WhMqsG2_aygXcercxfocZp7mkEMd-jmMPbm13_2OKg2AcVOGgCkfBSHVcRY5RMEa_OPpFQIrFEhnOX34iOB3B0Zp9fAUbf4tSgRL46-sC5er3Si2Exht4BukBhHk</recordid><startdate>200007</startdate><enddate>200007</enddate><creator>Westerhuis, Johan A.</creator><creator>Gurden, Stephen P.</creator><creator>Smilde, Age K.</creator><general>John Wiley & Sons, Ltd</general><general>Wiley</general><scope>BSCLL</scope><scope>IQODW</scope></search><sort><creationdate>200007</creationdate><title>Standardized Q-statistic for improved sensitivity in the monitoring of residuals in MSPC</title><author>Westerhuis, Johan A. ; Gurden, Stephen P. ; Smilde, Age K.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i2999-1bba5f3bb4a83272236a705b7ab343de537d570427fcca7264240b6e4bd664853</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2000</creationdate><topic>Chemistry</topic><topic>Exact sciences and technology</topic><topic>fault detection</topic><topic>General and physical chemistry</topic><topic>General. Nomenclature, chemical documentation, computer chemistry</topic><topic>process monitoring</topic><topic>Q-statistic</topic><topic>Theory of reactions, general kinetics. Catalysis. Nomenclature, chemical documentation, computer chemistry</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Westerhuis, Johan A.</creatorcontrib><creatorcontrib>Gurden, Stephen P.</creatorcontrib><creatorcontrib>Smilde, Age K.</creatorcontrib><collection>Istex</collection><collection>Pascal-Francis</collection><jtitle>Journal of chemometrics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Westerhuis, Johan A.</au><au>Gurden, Stephen P.</au><au>Smilde, Age K.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Standardized Q-statistic for improved sensitivity in the monitoring of residuals in MSPC</atitle><jtitle>Journal of chemometrics</jtitle><addtitle>J. Chemometrics</addtitle><date>2000-07</date><risdate>2000</risdate><volume>14</volume><issue>4</issue><spage>335</spage><epage>349</epage><pages>335-349</pages><issn>0886-9383</issn><eissn>1099-128X</eissn><coden>JOCHEU</coden><abstract>This paper presents the standardized Q‐statistic for monitoring residuals of latent variable models in multivariate statistical process control (MSPC). Before the summation of the squared residuals, they are scaled according to their expected variation obtained from normal operating conditions (NOC) data. Data from a simulated batch process and from an industrial batch process are used to show that this scaling improves the sensitivity of the Q‐statistic considerably. The standardized Q‐statistic is introduced for the off‐line monitoring of batch processes, but it can also be used for the monitoring of continuous processes as well as for the on‐line monitoring of batch processes. Copyright © 2000 John Wiley & Sons, Ltd.</abstract><cop>Chichester, UK</cop><pub>John Wiley & Sons, Ltd</pub><doi>10.1002/1099-128X(200007/08)14:4<335::AID-CEM579>3.0.CO;2-F</doi><tpages>15</tpages></addata></record> |
fulltext | fulltext |
identifier | ISSN: 0886-9383 |
ispartof | Journal of chemometrics, 2000-07, Vol.14 (4), p.335-349 |
issn | 0886-9383 1099-128X |
language | eng |
recordid | cdi_pascalfrancis_primary_1409603 |
source | Wiley |
subjects | Chemistry Exact sciences and technology fault detection General and physical chemistry General. Nomenclature, chemical documentation, computer chemistry process monitoring Q-statistic Theory of reactions, general kinetics. Catalysis. Nomenclature, chemical documentation, computer chemistry |
title | Standardized Q-statistic for improved sensitivity in the monitoring of residuals in MSPC |
url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-10T14%3A11%3A01IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-wiley_pasca&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Standardized%20Q-statistic%20for%20improved%20sensitivity%20in%20the%20monitoring%20of%20residuals%20in%20MSPC&rft.jtitle=Journal%20of%20chemometrics&rft.au=Westerhuis,%20Johan%20A.&rft.date=2000-07&rft.volume=14&rft.issue=4&rft.spage=335&rft.epage=349&rft.pages=335-349&rft.issn=0886-9383&rft.eissn=1099-128X&rft.coden=JOCHEU&rft_id=info:doi/10.1002/1099-128X(200007/08)14:4%3C335::AID-CEM579%3E3.0.CO;2-F&rft_dat=%3Cwiley_pasca%3ECEM579%3C/wiley_pasca%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-i2999-1bba5f3bb4a83272236a705b7ab343de537d570427fcca7264240b6e4bd664853%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |