Time-of-flight-SIMS and XPS characterization of metal doped polymers

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Bibliographic Details
Main Authors: GROSS, Th, RETZKO, I, FRIEDRICH, J, UNGER, W
Format: Conference Proceeding
Language:English
Subjects:
Atomic, molecular, and ion beam impact and interactions with surfaces
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Condensed matter: structure, mechanical and thermal properties
Electron and ion emission by liquids and solids
impact phenomena
Exact sciences and technology
Impact phenomena (including electron spectra and sputtering)
Langmuir-blodgett films
Physics
Surfaces and interfaces
thin films and whiskers (structure and nonelectronic properties)
Online Access:Get full text
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ISSN:0169-4332
1873-5584