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Time-of-flight-SIMS and XPS characterization of metal doped polymers
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| Format: | Conference Proceeding |
| Language: | English |
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| container_end_page | 579 |
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| container_start_page | 575 |
| container_title | |
| container_volume | 203-04 |
| creator | GROSS, Th RETZKO, I FRIEDRICH, J UNGER, W |
| description | |
| format | conference_proceeding |
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Condensed matter: electronic structure, electrical, magnetic, and optical properties ; Condensed matter: structure, mechanical and thermal properties ; Electron and ion emission by liquids and solids; impact phenomena ; Exact sciences and technology ; Impact phenomena (including electron spectra and sputtering) ; Langmuir-blodgett films ; Physics ; Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)</subject><ispartof>Applied surface science, 2003, Vol.203-04, p.575-579</ispartof><rights>2003 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>309,310,778,782,787,788,4038,4039,23913,23914,25123</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=14441580$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>GROSS, Th</creatorcontrib><creatorcontrib>RETZKO, I</creatorcontrib><creatorcontrib>FRIEDRICH, J</creatorcontrib><creatorcontrib>UNGER, W</creatorcontrib><title>Time-of-flight-SIMS and XPS characterization of metal doped polymers</title><title>Applied surface science</title><subject>Atomic, molecular, and ion beam impact and interactions with surfaces</subject><subject>Condensed matter: electronic structure, electrical, magnetic, and optical properties</subject><subject>Condensed matter: structure, mechanical and thermal properties</subject><subject>Electron and ion emission by liquids and solids; impact phenomena</subject><subject>Exact sciences and technology</subject><subject>Impact phenomena (including electron spectra and sputtering)</subject><subject>Langmuir-blodgett films</subject><subject>Physics</subject><subject>Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)</subject><issn>0169-4332</issn><issn>1873-5584</issn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2003</creationdate><recordtype>conference_proceeding</recordtype><recordid>eNqNyrsOwiAYQGFiNLFe3oHFkQQK1Tp7iQ4mJu3g1vyhYDFQGmCpT6-DD-B0hu9MUMbKHSdFUYopyijb7ongPJ-jRYwvSln-1Qwda-MU8Zpoa55dItX1VmHoW_y4V1h2EEAmFcwbkvE99ho7lcDi1g-qxYO3o1MhrtBMg41q_esSbc6n-nAhA0QJVgfopYnNEIyDMDZMCMGKkvJ_vw_VZD00</recordid><startdate>2003</startdate><enddate>2003</enddate><creator>GROSS, Th</creator><creator>RETZKO, I</creator><creator>FRIEDRICH, J</creator><creator>UNGER, W</creator><general>Elsevier Science</general><scope>IQODW</scope></search><sort><creationdate>2003</creationdate><title>Time-of-flight-SIMS and XPS characterization of metal doped polymers</title><author>GROSS, Th ; RETZKO, I ; FRIEDRICH, J ; UNGER, W</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-pascalfrancis_primary_144415803</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2003</creationdate><topic>Atomic, molecular, and ion beam impact and interactions with surfaces</topic><topic>Condensed matter: electronic structure, electrical, magnetic, and optical properties</topic><topic>Condensed matter: structure, mechanical and thermal properties</topic><topic>Electron and ion emission by liquids and solids; impact phenomena</topic><topic>Exact sciences and technology</topic><topic>Impact phenomena (including electron spectra and sputtering)</topic><topic>Langmuir-blodgett films</topic><topic>Physics</topic><topic>Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>GROSS, Th</creatorcontrib><creatorcontrib>RETZKO, I</creatorcontrib><creatorcontrib>FRIEDRICH, J</creatorcontrib><creatorcontrib>UNGER, W</creatorcontrib><collection>Pascal-Francis</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>GROSS, Th</au><au>RETZKO, I</au><au>FRIEDRICH, J</au><au>UNGER, W</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Time-of-flight-SIMS and XPS characterization of metal doped polymers</atitle><btitle>Applied surface science</btitle><date>2003</date><risdate>2003</risdate><volume>203-04</volume><spage>575</spage><epage>579</epage><pages>575-579</pages><issn>0169-4332</issn><eissn>1873-5584</eissn><cop>Amsterdam</cop><pub>Elsevier Science</pub></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 0169-4332 |
| ispartof | Applied surface science, 2003, Vol.203-04, p.575-579 |
| issn | 0169-4332 1873-5584 |
| language | eng |
| recordid | cdi_pascalfrancis_primary_14441580 |
| source | Elsevier |
| subjects | Atomic, molecular, and ion beam impact and interactions with surfaces Condensed matter: electronic structure, electrical, magnetic, and optical properties Condensed matter: structure, mechanical and thermal properties Electron and ion emission by liquids and solids impact phenomena Exact sciences and technology Impact phenomena (including electron spectra and sputtering) Langmuir-blodgett films Physics Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties) |
| title | Time-of-flight-SIMS and XPS characterization of metal doped polymers |
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