Initial electron back-scattered diffraction observations of cerium

The first electron back-scattered diffraction Kikuchi patterns and grain orientation maps were captured for pure n-phase (fcc) Ce. The sample preparation technique used for electron back-scattered diffraction orientation mapping of this surface-reactive metal included ion sputtering the surface usin...

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Bibliographic Details
Published in:Philosophical magazine (Abingdon, England) England), 2003-05, Vol.83 (14), p.1735-1744
Main Authors: Boehlert, C. J., Farr, J. D., Schulze, R. K., Pereyra, R. A., Archuleta, J. A.
Format: Article
Language:English
Subjects:
Applied sciences
Condensed matter: structure, mechanical and thermal properties
Convergent-beam electron diffraction, selected-area electron diffraction, nanodiffraction
Electron diffraction and scattering
Exact sciences and technology
Metals. Metallurgy
Physics
Structure of solids and liquids
crystallography
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Summary:The first electron back-scattered diffraction Kikuchi patterns and grain orientation maps were captured for pure n-phase (fcc) Ce. The sample preparation technique used for electron back-scattered diffraction orientation mapping of this surface-reactive metal included ion sputtering the surface using a scanning Auger microprobe followed by vacuum transfer of the sample from the scanning Auger microprobe to the scanning electron microscope. The effect of ion sputtering on the microstructure as well as preliminary electron back-scattered diffraction microstructural characterization is presented. Based on the sputtering data, the room-temperature diffusivity of O in n-Ce was estimated.
ISSN:1478-6435
1478-6443
DOI:10.1080/1478643031000080708