Twinning in La0.95Sr0.05Ga0.9Mg0.1O2.92 crystal studied by white-beam (Laue) X-ray microdiffraction

The investigation of twin structure in La0.95Sr0.05Ga0.9Mg0.1O2.92 perovskite‐type crystals has been undertaken using the technique of white‐beam X‐ray microdiffraction. The sample shows definite twinning which is reflected in the Laue patterns as apparent splitting of the peaks. Reflections from th...

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Bibliographic Details
Published in:Journal of applied crystallography 2003-10, Vol.36 (5), p.1197-1203
Main Authors: Savytskii, D. I., Trots, D. M., Vasylechko, L. O., Tamura, N., Berkowski, M.
Format: Article
Language:English
Subjects:
Condensed matter: structure, mechanical and thermal properties
Defects and impurities in crystals
microstructure
Exact sciences and technology
Grain and twin boundaries
perovskite
Physics
Single-crystal and powder diffraction
Structure of solids and liquids
crystallography
twinning
white-beam (Laue) X-ray microdiffraction
X-ray diffraction and scattering
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Summary:The investigation of twin structure in La0.95Sr0.05Ga0.9Mg0.1O2.92 perovskite‐type crystals has been undertaken using the technique of white‐beam X‐ray microdiffraction. The sample shows definite twinning which is reflected in the Laue patterns as apparent splitting of the peaks. Reflections from the different domains were indexed separately. Positional shifts of twin domain spots with respect to the reference matrix spot, arising from the mutual misorientation of diffraction vectors, were measured on Laue patterns and compared with calculated values in order to solve the twin laws in this system. The dominant twin operations were found to be (12) and () mirror reflections.
ISSN:1600-5767
0021-8898
1600-5767
DOI:10.1107/S002188980301433X