Electrostatic discharge induced oxide breakdown characterization in a 0.1 μm CMOS technology

Saved in:
Bibliographic Details
Main Authors: SALMAN, Akram, GAUTHIER, Robert, WU, Ernest, RIESS, Philipp, PUTNAM, Chris, MULLAMMAD, Mujahid, MIN WOO, IOANNOU, Dimitris
Format: Conference Proceeding
Language:English
Subjects:
Applied sciences
Electronics
Exact sciences and technology
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Testing, measurement, noise and reliability
Transistors
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:
DOI:10.1109/RELPHY.2002.996631