New insights in high-energy electron emission and underlying transport physics of nanocrystalline Si

This paper presents quantitative analysis of electron emission from nanocrystalline Si dots, and discusses its mechanism based on the calculations of electronic and phononic states. Analysis of emission energy distribution measured from the vacuum level shows that the energy at the peak of the distr...

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Bibliographic Details
Published in:IEEE transactions on nanotechnology 2003-12, Vol.2 (4), p.301-307
Main Authors: Uno, S., Nakazato, K., Yamaguchi, S., Kojima, A., Koshida, N., Mizuta, H.
Format: Article
Language:English
Subjects:
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Diodes
Electric potential
Electrodes
Electron and ion emission by liquids and solids
impact phenomena
Electron emission
Electronics
Elementary particle vacuum
Energy distribution
Energy measurement
Exact sciences and technology
Field emission, ionization, evaporation, and desorption
Gold
Mathematical models
Nanocrystals
Physics
Shape
Silicon
Voltage
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Summary:This paper presents quantitative analysis of electron emission from nanocrystalline Si dots, and discusses its mechanism based on the calculations of electronic and phononic states. Analysis of emission energy distribution measured from the vacuum level shows that the energy at the peak of the distribution increases linearly with increasing voltage applied across the nanocrystalline Si system. The slope of the linear law is unity, regardless of process conditions. Increasing voltage significantly changes the shape of the distribution at the energies smaller than the peak, while it has minimal impact at the energies larger than the peak. Both the conventional field emission model and the metal-oxide-semiconductor model fail to explain those behaviors. Calculations of electronic and phononic states in a chain of the nanocrystalline Si dots indicate a possibility of strong suppression of electron energy relaxation, which may be a possible mechanism of the high-energy electron emission phenomena.
ISSN:1536-125X
1941-0085
DOI:10.1109/TNANO.2003.820508