High frequency characterization of the semi-conducting screens of medium voltage XLPE cables

In this study, a high frequency measurement technique to characterize the semi-conducting materials of the medium voltage XLPE cables in the frequency range of 30 kHz to 500 MHz has been developed. The influence of the experimental set-up and the sample preparation methods are investigated. A dielec...

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Bibliographic Details
Main Authors: Mugala, G., Eriksson, R., Gafvert, U.
Format: Conference Proceeding
Language:English
Subjects:
Admittance
Applied sciences
Cables
Conducting materials
Dielectric measurements
Electric connection. Cables. Wiring
Electrical engineering. Electrical power engineering
Electrical power engineering
Exact sciences and technology
Frequency measurement
Impedance
Inductance
Insulation
Medium voltage
Permittivity measurement
Power networks and lines
Various equipment and components
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Description
Summary:In this study, a high frequency measurement technique to characterize the semi-conducting materials of the medium voltage XLPE cables in the frequency range of 30 kHz to 500 MHz has been developed. The influence of the experimental set-up and the sample preparation methods are investigated. A dielectric response model is then developed for the semiconducting materials and this is incorporated into a model for the whole cable. The propagation characteristics obtained from the cable model are then compared with those obtained from measurements carried out on the actual XLPE cables.
DOI:10.1109/CEIDP.2002.1048937