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Influence of reactor walls on plasma chemistry and on silicon etch product densities during silicon etching processes in halogen-based plasmas
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Published in: | Plasma sources science & technology 2004-08, Vol.13 (3), p.522-530 |
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Format: | Article |
Language: | English |
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cited_by | cdi_FETCH-LOGICAL-c328t-304dc13d5efa673beb1d2597cfb4c1f8d6ffd8b36686bbaa7d74260845b211773 |
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cites | cdi_FETCH-LOGICAL-c328t-304dc13d5efa673beb1d2597cfb4c1f8d6ffd8b36686bbaa7d74260845b211773 |
container_end_page | 530 |
container_issue | 3 |
container_start_page | 522 |
container_title | Plasma sources science & technology |
container_volume | 13 |
creator | Cunge, G Kogelschatz, M Sadeghi, N |
description | |
doi_str_mv | 10.1088/0963-0252/13/3/019 |
format | article |
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ispartof | Plasma sources science & technology, 2004-08, Vol.13 (3), p.522-530 |
issn | 0963-0252 1361-6595 |
language | eng |
recordid | cdi_pascalfrancis_primary_16057654 |
source | Institute of Physics |
subjects | Exact sciences and technology Physics Physics of gases, plasmas and electric discharges Physics of plasmas and electric discharges Plasma applications |
title | Influence of reactor walls on plasma chemistry and on silicon etch product densities during silicon etching processes in halogen-based plasmas |
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