Partial discharge failure analysis of AlN substrates for IGBT modules

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Bibliographic Details
Main Authors: FABIAN, J.-H, HARTMANN, S, HAMIDI, A
Format: Conference Proceeding
Language:English
Subjects:
Applied sciences
Design. Technologies. Operation analysis. Testing
Electronics
Exact sciences and technology
Integrated circuits
Microelectronic fabrication (materials and surfaces technology)
Other multijunction devices. Power transistors. Thyristors
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Testing, measurement, noise and reliability
Online Access:Get full text
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Summary:
ISSN:0026-2714
1872-941X
DOI:10.1016/j.microrel.2004.07.111