A new aberration correction method for photoemission electron microscopy by means of moving focus

A new aberration correction method has been developed for photoemission electron microscopy (PEEM). In order to correct the spherical and chromatic aberrations, a moving focus method was adopted. Several experimental limitations to achieving optimal resolution have also been overcome. A high brightn...

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Bibliographic Details
Published in:Journal of physics. Condensed matter 2005-04, Vol.17 (16), p.S1371-S1380
Main Authors: Koshikawa, T, Shimizu, H, Amakawa, R, Ikuta, T, Yasue, T, Bauer, E
Format: Article
Language:English
Subjects:
Electron, positron and ion microscopes, electron diffractometers and related techniques
Exact sciences and technology
Instruments, apparatus, components and techniques common to several branches of physics and astronomy
Physics
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Summary:A new aberration correction method has been developed for photoemission electron microscopy (PEEM). In order to correct the spherical and chromatic aberrations, a moving focus method was adopted. Several experimental limitations to achieving optimal resolution have also been overcome. A high brightness Hg lamp system has been developed to overcome the insufficient brightness of the conventional Hg lamp. An improvement of brightness by over 100 times as compared with the conventional lamp was achieved. Image blur was also found due to a weak environmental AC magnetic field caused by essential microscope components, i.e., the power transformer and CCD camera. After implementing the high brightness lamp and eliminating stray magnetic field by proper shielding, preliminary experiments demonstrate that aberration correction by moving focus can improve the PEEM image resolution.
ISSN:0953-8984
1361-648X
DOI:10.1088/0953-8984/17/16/008