A novel active feedback flyback with only 100-mV inductive overshoot for a standard low-voltage CMOS inductive load driver, in a single-chip controller for 73 relays in a POTS/ADSL splitter application

This paper presents an inductive load driver. The circuit is realized in a standard low-voltage CMOS process: as the coil freewheels when the driver is switched off, the circuit clamps the output voltage at 100 mV above the power supply. Hence, no high-voltage technology or high-voltage tolerant cir...

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Bibliographic Details
Published in:IEEE journal of solid-state circuits 2005-07, Vol.40 (7), p.1541-1548
Main Authors: Wouters, J.F.J., Sevenhans, J., Van Hoogenbemt, S., Fernandez, T., Biggs, J., Das, C., Dupont, S.A.M.
Format: Article
Language:English
Subjects:
Applied sciences
Circuit properties
Circuit testing
Circuits
Clamps
CMOS
CMOS process
Coils
Design. Technologies. Operation analysis. Testing
Driver circuits
Drivers
Electric potential
Electric, optical and optoelectronic circuits
Electronic circuits
Electronic equipment and fabrication. Passive components, printed wiring boards, connectics
Electronics
Exact sciences and technology
Feedback
flyback
inductive load
Integrated circuits
low-side driver
overcurrent protection
overvoltage protection
Pots
Power supplies
Relays
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
short-circuit protection
Signal convertors
slope control
Subscriber line
Switching circuits
Voltage
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Description
Summary:This paper presents an inductive load driver. The circuit is realized in a standard low-voltage CMOS process: as the coil freewheels when the driver is switched off, the circuit clamps the output voltage at 100 mV above the power supply. Hence, no high-voltage technology or high-voltage tolerant circuit is required. 73 drivers are integrated in an ASIC, controlling 73 relays for a test access function on a POTS/ADSL splitter filter board. The driver also performs output voltage slope control and has an elegant, effective short-circuit protection.
ISSN:0018-9200
1558-173X
DOI:10.1109/JSSC.2005.847494