Challenges for interconnect of future CMOS generations : Implementation of emerging processes and alternative architectures

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Bibliographic Details
Main Authors: ARNAL, V, GOSSET, L. G, GUILLAUMOND, J. F, TORRES, J, BESLING, W. F. A, FARCY, A, CHAPELON, L. L, FUCHSMANN, A, VITIELLO, J, CHHUN, S, AIMADEDDINE, M, GUEDJ, C
Format: Conference Proceeding
Language:English
Subjects:
Applied sciences
Design. Technologies. Operation analysis. Testing
Electronics
Exact sciences and technology
Integrated circuits
Microelectronic fabrication (materials and surfaces technology)
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Online Access:Get full text
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ISSN:0161-6374
2576-1579