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Low-temperature growth of perpendicular FePt films
L1/sub 0/ FePt films with high perpendicular coercivity were successfully fabricated by using Cr/sub 65/Mo/sub 15/Mn/sub 20/ underlayers with subsequent forming gas (Ar 95% + H/sub 2/ 5%;) annealing. To adjust the strain energy and the orientation of FePt, Fe and Pt intermediate layers were used. Sa...
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Published in: | IEEE transactions on magnetics 2005-10, Vol.41 (10), p.3199-3201 |
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creator | Yun-Chung Wu Chih-Huang Lai Chao-Chien Chiang Huang, R.T. |
description | L1/sub 0/ FePt films with high perpendicular coercivity were successfully fabricated by using Cr/sub 65/Mo/sub 15/Mn/sub 20/ underlayers with subsequent forming gas (Ar 95% + H/sub 2/ 5%;) annealing. To adjust the strain energy and the orientation of FePt, Fe and Pt intermediate layers were used. Samples annealed at 275/spl deg/C with thin Pt layers ( |
doi_str_mv | 10.1109/TMAG.2005.855269 |
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To adjust the strain energy and the orientation of FePt, Fe and Pt intermediate layers were used. Samples annealed at 275/spl deg/C with thin Pt layers (<5 nm) show relatively small coercivity due to the stabilizing effects from the underlayers. With the increasing thickness of Pt, the strain was locally released and the (111) grains appeared. The nucleation of the ordered L1/sub 0/ FePt phase accompanied the formation of the FePt (111) phase, resulting in a high coercivity but deteriorated perpendicular anisotropy. To maintain the [001] preferred orientation with high coercivity, the sample with a 3.5-nm Pt layer was annealed at 350/spl deg/C. The coercivity as high as 8400 Oe was realized.</description><identifier>ISSN: 0018-9464</identifier><identifier>EISSN: 1941-0069</identifier><identifier>DOI: 10.1109/TMAG.2005.855269</identifier><identifier>CODEN: IEMGAQ</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Anisotropic magnetoresistance ; Annealing ; Capacitive sensors ; Coercive force ; Cross-disciplinary physics: materials science; rheology ; Exact sciences and technology ; FePt ; forming gas annealing ; Iron ; Magnetic films ; Magnetism ; Materials science ; Other topics in materials science ; Perpendicular magnetic recording ; perpendicular media ; Physics ; Plasma temperature ; Substrates ; X-ray scattering</subject><ispartof>IEEE transactions on magnetics, 2005-10, Vol.41 (10), p.3199-3201</ispartof><rights>2006 INIST-CNRS</rights><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2005</rights><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c382t-4604139cea2e7caa535386e0a7a527dbbd5d9df8941e7b5b1c69532c11e05633</citedby><cites>FETCH-LOGICAL-c382t-4604139cea2e7caa535386e0a7a527dbbd5d9df8941e7b5b1c69532c11e05633</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/1519252$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,314,780,784,789,790,23930,23931,25140,27924,27925,54796</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=17231017$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Yun-Chung Wu</creatorcontrib><creatorcontrib>Chih-Huang Lai</creatorcontrib><creatorcontrib>Chao-Chien Chiang</creatorcontrib><creatorcontrib>Huang, R.T.</creatorcontrib><title>Low-temperature growth of perpendicular FePt films</title><title>IEEE transactions on magnetics</title><addtitle>TMAG</addtitle><description>L1/sub 0/ FePt films with high perpendicular coercivity were successfully fabricated by using Cr/sub 65/Mo/sub 15/Mn/sub 20/ underlayers with subsequent forming gas (Ar 95% + H/sub 2/ 5%;) annealing. To adjust the strain energy and the orientation of FePt, Fe and Pt intermediate layers were used. Samples annealed at 275/spl deg/C with thin Pt layers (<5 nm) show relatively small coercivity due to the stabilizing effects from the underlayers. With the increasing thickness of Pt, the strain was locally released and the (111) grains appeared. The nucleation of the ordered L1/sub 0/ FePt phase accompanied the formation of the FePt (111) phase, resulting in a high coercivity but deteriorated perpendicular anisotropy. To maintain the [001] preferred orientation with high coercivity, the sample with a 3.5-nm Pt layer was annealed at 350/spl deg/C. The coercivity as high as 8400 Oe was realized.</description><subject>Anisotropic magnetoresistance</subject><subject>Annealing</subject><subject>Capacitive sensors</subject><subject>Coercive force</subject><subject>Cross-disciplinary physics: materials science; rheology</subject><subject>Exact sciences and technology</subject><subject>FePt</subject><subject>forming gas annealing</subject><subject>Iron</subject><subject>Magnetic films</subject><subject>Magnetism</subject><subject>Materials science</subject><subject>Other topics in materials science</subject><subject>Perpendicular magnetic recording</subject><subject>perpendicular media</subject><subject>Physics</subject><subject>Plasma temperature</subject><subject>Substrates</subject><subject>X-ray scattering</subject><issn>0018-9464</issn><issn>1941-0069</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2005</creationdate><recordtype>article</recordtype><recordid>eNqNkE1LAzEQhoMoWKt3wcsi6G1rvjc5lmKrUNFD7yGbndUt-1GTXYr_3pQtFDx5CpN55mXmQeiW4BkhWD9t3uarGcVYzJQQVOozNCGakxRjqc_RBGOiUs0lv0RXIWxjyQXBE0TX3T7todmBt_3gIfn03b7_SroyiV87aIvKDbX1yRI--qSs6iZco4vS1gFuju8UbZbPm8VLun5fvS7m69QxRfuUS8wJ0w4shcxZK5hgSgK2mRU0K_K8EIUuShWXhCwXOXFSC0YdIYCFZGyKHsfYne--Bwi9aargoK5tC90QDFUxXWD6DzAeqwSP4P0fcNsNvo03GCUzLqMSESE8Qs53IXgozc5XjfU_hmBzMG0Ops3BtBlNx5GHY64Nztalt62rwmkuo4xgkkXubuQqADi1BdFUUPYLCF2EvA</recordid><startdate>20051001</startdate><enddate>20051001</enddate><creator>Yun-Chung Wu</creator><creator>Chih-Huang Lai</creator><creator>Chao-Chien Chiang</creator><creator>Huang, R.T.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><general>The Institute of Electrical and Electronics Engineers, Inc. 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To adjust the strain energy and the orientation of FePt, Fe and Pt intermediate layers were used. Samples annealed at 275/spl deg/C with thin Pt layers (<5 nm) show relatively small coercivity due to the stabilizing effects from the underlayers. With the increasing thickness of Pt, the strain was locally released and the (111) grains appeared. The nucleation of the ordered L1/sub 0/ FePt phase accompanied the formation of the FePt (111) phase, resulting in a high coercivity but deteriorated perpendicular anisotropy. To maintain the [001] preferred orientation with high coercivity, the sample with a 3.5-nm Pt layer was annealed at 350/spl deg/C. The coercivity as high as 8400 Oe was realized.</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/TMAG.2005.855269</doi><tpages>3</tpages></addata></record> |
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subjects | Anisotropic magnetoresistance Annealing Capacitive sensors Coercive force Cross-disciplinary physics: materials science rheology Exact sciences and technology FePt forming gas annealing Iron Magnetic films Magnetism Materials science Other topics in materials science Perpendicular magnetic recording perpendicular media Physics Plasma temperature Substrates X-ray scattering |
title | Low-temperature growth of perpendicular FePt films |
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