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Sliding windows in non-destructive testing systems

It is very important to improve noise immunity in ultrasonic nondestructive testing systems. This objective is achieved by reflected signal de-noising. The wavelets transform based methods are widely used for noise reduction in recent time. Effectiveness of the wavelets transform based de-noising pr...

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Main Authors:	Kazanavicius, E., Mikuckas, A., Mikuckiene, L.
Format:	Conference Proceeding
Language:	English
Subjects:	Applied sciences Computer science control theory systems Control theory. Systems Electronic equipment testing Exact sciences and technology Laboratories Noise cancellation Noise reduction Nondestructive testing Signal processing Signal to noise ratio System testing Wavelet transforms Working environment noise
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creator	Kazanavicius, E. Mikuckas, A. Mikuckiene, L.
description	It is very important to improve noise immunity in ultrasonic nondestructive testing systems. This objective is achieved by reflected signal de-noising. The wavelets transform based methods are widely used for noise reduction in recent time. Effectiveness of the wavelets transform based de-noising procedure depends on the signal to noise ratio. The signal to noise ratio in a non-destructive testing system depends not only on the noise level, but also on the length of the signal to be processed. Reducing the length of the signal to be processed may increase noise immunity. sliding windows allow reducing the length of the signal to be processed. Execution of this method not only improves noise immunity of the system, but also requires fewer amounts of calculations.
doi_str_mv	10.1109/ISIC.2004.1387725
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fullrecord	<record><control><sourceid>pascalfrancis_6IE</sourceid><recordid>TN_cdi_pascalfrancis_primary_17415069</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>1387725</ieee_id><sourcerecordid>17415069</sourcerecordid><originalsourceid>FETCH-LOGICAL-i509-ada458a924fb943f001344f878b9a4f4d30cd84557a14959b64b16d2d62f74d23</originalsourceid><addsrcrecordid>eNpFkE1LAzEYhIMfYK39AeJlLx63vknefB1l8WOh4KG9l-wmkcg2LZvV0n_vyorOZQbmYQ5DyC2FJaVgHup1XS0ZAC4p10oxcUZmjApdGq3MObkGpYFryQW_-CskXJFFzh8wCgVSxmeErbvoYnovjjG5_TEXMRVpn0rn89B_tkP88sUw5h8kn_Lgd_mGXAbbZb_49TnZPD9tqtdy9fZSV4-rMgowpXUWhbaGYWgM8gBAOWLQSjfGYkDHoXUahVCWohGmkdhQ6ZiTLCh0jM_J_TR7sLm1XehtamPeHvq4s_1pSxVSAdKM3N3ERe_9fz29wr8BMDhSjQ</addsrcrecordid><sourcetype>Index Database</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Sliding windows in non-destructive testing systems</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Kazanavicius, E. ; Mikuckas, A. ; Mikuckiene, L.</creator><creatorcontrib>Kazanavicius, E. ; Mikuckas, A. ; Mikuckiene, L.</creatorcontrib><description>It is very important to improve noise immunity in ultrasonic nondestructive testing systems. This objective is achieved by reflected signal de-noising. The wavelets transform based methods are widely used for noise reduction in recent time. Effectiveness of the wavelets transform based de-noising procedure depends on the signal to noise ratio. The signal to noise ratio in a non-destructive testing system depends not only on the noise level, but also on the length of the signal to be processed. Reducing the length of the signal to be processed may increase noise immunity. sliding windows allow reducing the length of the signal to be processed. Execution of this method not only improves noise immunity of the system, but also requires fewer amounts of calculations.</description><identifier>ISSN: 2158-9860</identifier><identifier>ISBN: 0780386353</identifier><identifier>ISBN: 9780780386358</identifier><identifier>EISSN: 2158-9879</identifier><identifier>DOI: 10.1109/ISIC.2004.1387725</identifier><language>eng</language><publisher>Piscataway, NJ: IEEE</publisher><subject>Applied sciences ; Computer science; control theory; systems ; Control theory. Systems ; Electronic equipment testing ; Exact sciences and technology ; Laboratories ; Noise cancellation ; Noise reduction ; Nondestructive testing ; Signal processing ; Signal to noise ratio ; System testing ; Wavelet transforms ; Working environment noise</subject><ispartof>Proceedings of the 2004 IEEE International Symposium on Intelligent Control, 2004, 2004, p.448-453</ispartof><rights>2006 INIST-CNRS</rights><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/1387725$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2058,4050,4051,27925,54555,54920,54932</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/1387725$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=17415069$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Kazanavicius, E.</creatorcontrib><creatorcontrib>Mikuckas, A.</creatorcontrib><creatorcontrib>Mikuckiene, L.</creatorcontrib><title>Sliding windows in non-destructive testing systems</title><title>Proceedings of the 2004 IEEE International Symposium on Intelligent Control, 2004</title><addtitle>ISIC</addtitle><description>It is very important to improve noise immunity in ultrasonic nondestructive testing systems. This objective is achieved by reflected signal de-noising. The wavelets transform based methods are widely used for noise reduction in recent time. Effectiveness of the wavelets transform based de-noising procedure depends on the signal to noise ratio. The signal to noise ratio in a non-destructive testing system depends not only on the noise level, but also on the length of the signal to be processed. Reducing the length of the signal to be processed may increase noise immunity. sliding windows allow reducing the length of the signal to be processed. Execution of this method not only improves noise immunity of the system, but also requires fewer amounts of calculations.</description><subject>Applied sciences</subject><subject>Computer science; control theory; systems</subject><subject>Control theory. Systems</subject><subject>Electronic equipment testing</subject><subject>Exact sciences and technology</subject><subject>Laboratories</subject><subject>Noise cancellation</subject><subject>Noise reduction</subject><subject>Nondestructive testing</subject><subject>Signal processing</subject><subject>Signal to noise ratio</subject><subject>System testing</subject><subject>Wavelet transforms</subject><subject>Working environment noise</subject><issn>2158-9860</issn><issn>2158-9879</issn><isbn>0780386353</isbn><isbn>9780780386358</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2004</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><recordid>eNpFkE1LAzEYhIMfYK39AeJlLx63vknefB1l8WOh4KG9l-wmkcg2LZvV0n_vyorOZQbmYQ5DyC2FJaVgHup1XS0ZAC4p10oxcUZmjApdGq3MObkGpYFryQW_-CskXJFFzh8wCgVSxmeErbvoYnovjjG5_TEXMRVpn0rn89B_tkP88sUw5h8kn_Lgd_mGXAbbZb_49TnZPD9tqtdy9fZSV4-rMgowpXUWhbaGYWgM8gBAOWLQSjfGYkDHoXUahVCWohGmkdhQ6ZiTLCh0jM_J_TR7sLm1XehtamPeHvq4s_1pSxVSAdKM3N3ERe_9fz29wr8BMDhSjQ</recordid><startdate>2004</startdate><enddate>2004</enddate><creator>Kazanavicius, E.</creator><creator>Mikuckas, A.</creator><creator>Mikuckiene, L.</creator><general>IEEE</general><general>IEEE Service Center</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope><scope>IQODW</scope></search><sort><creationdate>2004</creationdate><title>Sliding windows in non-destructive testing systems</title><author>Kazanavicius, E. ; Mikuckas, A. ; Mikuckiene, L.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i509-ada458a924fb943f001344f878b9a4f4d30cd84557a14959b64b16d2d62f74d23</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2004</creationdate><topic>Applied sciences</topic><topic>Computer science; control theory; systems</topic><topic>Control theory. Systems</topic><topic>Electronic equipment testing</topic><topic>Exact sciences and technology</topic><topic>Laboratories</topic><topic>Noise cancellation</topic><topic>Noise reduction</topic><topic>Nondestructive testing</topic><topic>Signal processing</topic><topic>Signal to noise ratio</topic><topic>System testing</topic><topic>Wavelet transforms</topic><topic>Working environment noise</topic><toplevel>online_resources</toplevel><creatorcontrib>Kazanavicius, E.</creatorcontrib><creatorcontrib>Mikuckas, A.</creatorcontrib><creatorcontrib>Mikuckiene, L.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection><collection>Pascal-Francis</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Kazanavicius, E.</au><au>Mikuckas, A.</au><au>Mikuckiene, L.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Sliding windows in non-destructive testing systems</atitle><btitle>Proceedings of the 2004 IEEE International Symposium on Intelligent Control, 2004</btitle><stitle>ISIC</stitle><date>2004</date><risdate>2004</risdate><spage>448</spage><epage>453</epage><pages>448-453</pages><issn>2158-9860</issn><eissn>2158-9879</eissn><isbn>0780386353</isbn><isbn>9780780386358</isbn><abstract>It is very important to improve noise immunity in ultrasonic nondestructive testing systems. This objective is achieved by reflected signal de-noising. The wavelets transform based methods are widely used for noise reduction in recent time. Effectiveness of the wavelets transform based de-noising procedure depends on the signal to noise ratio. The signal to noise ratio in a non-destructive testing system depends not only on the noise level, but also on the length of the signal to be processed. Reducing the length of the signal to be processed may increase noise immunity. sliding windows allow reducing the length of the signal to be processed. Execution of this method not only improves noise immunity of the system, but also requires fewer amounts of calculations.</abstract><cop>Piscataway, NJ</cop><pub>IEEE</pub><doi>10.1109/ISIC.2004.1387725</doi><tpages>6</tpages></addata></record>
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language	eng
recordid	cdi_pascalfrancis_primary_17415069
source	IEEE Electronic Library (IEL) Conference Proceedings
subjects	Applied sciences Computer science control theory systems Control theory. Systems Electronic equipment testing Exact sciences and technology Laboratories Noise cancellation Noise reduction Nondestructive testing Signal processing Signal to noise ratio System testing Wavelet transforms Working environment noise
title	Sliding windows in non-destructive testing systems
url	http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-02T20%3A32%3A48IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-pascalfrancis_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Sliding%20windows%20in%20non-destructive%20testing%20systems&rft.btitle=Proceedings%20of%20the%202004%20IEEE%20International%20Symposium%20on%20Intelligent%20Control,%202004&rft.au=Kazanavicius,%20E.&rft.date=2004&rft.spage=448&rft.epage=453&rft.pages=448-453&rft.issn=2158-9860&rft.eissn=2158-9879&rft.isbn=0780386353&rft.isbn_list=9780780386358&rft_id=info:doi/10.1109/ISIC.2004.1387725&rft_dat=%3Cpascalfrancis_6IE%3E17415069%3C/pascalfrancis_6IE%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-i509-ada458a924fb943f001344f878b9a4f4d30cd84557a14959b64b16d2d62f74d23%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=1387725&rfr_iscdi=true