Frequency analysis of atomic force microscopes with repulsive-attractive interaction potentials

The paper deals with harmonic balance analysis of tapping mode atomic force microscopes. The separation-amplitude curve is analytically evaluated for a large class of common tip-sample interaction potentials. The proposed approach provides an useful insight of many nonlinear known phenomena with res...

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Main Authors: Materassi, D., Basso, M., Genesio, R.
Format: Conference Proceeding
Language:English
Subjects:
Applied sciences
Atomic force microscopy
Biological system modeling
Biomedical optical imaging
Computer science
control theory
systems
Control theory. Systems
Exact sciences and technology
Frequency
Harmonic analysis
Image resolution
Instruments
Nanobioscience
Nanoscale devices
Surface topography
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creator Materassi, D.
Basso, M.
Genesio, R.
description The paper deals with harmonic balance analysis of tapping mode atomic force microscopes. The separation-amplitude curve is analytically evaluated for a large class of common tip-sample interaction potentials. The proposed approach provides an useful insight of many nonlinear known phenomena with respect to fully numerical approaches.
doi_str_mv 10.1109/CDC.2004.1428934
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identifier ISSN: 0191-2216
ispartof 2004 43rd IEEE Conference on Decision and Control (CDC) (IEEE Cat. No.04CH37601), 2004, Vol.3, p.3059-3061 Vol.3
issn 0191-2216
language eng
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source IEEE Electronic Library (IEL) Conference Proceedings
subjects Applied sciences
Atomic force microscopy
Biological system modeling
Biomedical optical imaging
Computer science
control theory
systems
Control theory. Systems
Exact sciences and technology
Frequency
Harmonic analysis
Image resolution
Instruments
Nanobioscience
Nanoscale devices
Surface topography
title Frequency analysis of atomic force microscopes with repulsive-attractive interaction potentials
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