Fine-grain abstraction and sequential don't cares for large scale model checking

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Bibliographic Details
Main Authors: CHAO WANG, HACHTEL, Gary D, SOMENZI, Fabio
Format: Conference Proceeding
Language:English
Subjects:
Applied sciences
Design. Technologies. Operation analysis. Testing
Electronics
Exact sciences and technology
Integrated circuits
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Online Access:Get full text
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