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Germanium p- & n-MOSFETs fabricated with novel surface passivation (plasma-PH3 and thin AlN) and TaN/HfO2 gate stack

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Bibliographic Details
Main Authors: WHANG, S. J, LEE, S. J, FEI GAO, NAN WU, ZHU, C. X, JI SHENG PAN, LEI JUN TANG, KWONG, D. L
Format: Conference Proceeding
Language:English
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DOI:10.1109/IEDM.2004.1419140