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45nm nMOSFET with metal gate on thin SiON driving 1150μA/μm and off-state of 10nA/μn
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creator | HENSON, K LANDER, R. J. P BECKX, S BOULLART, W COENEGRACHTS, B VERTOMMEN, J RICHARD, O BENDER, H VANDERVORST, W KAISER, M EVERAERT, J.-L JURCZAK, M DEMAND, M BIESEMANS, S DACHS, C. J. J KACZER, B DEWEERD, W SCHRAM, T TOKEI, Z HOOKER, J. C CUBAYNES, F. N |
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fullrecord | <record><control><sourceid>pascalfrancis</sourceid><recordid>TN_cdi_pascalfrancis_primary_17806545</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>17806545</sourcerecordid><originalsourceid>FETCH-pascalfrancis_primary_178065453</originalsourceid><addsrcrecordid>eNpjZuAyMLcwMLYwszAx5GDgLS7OMgACE1MTAwtjToZwE9O8XIU8X_9gN9cQhfLMkgyF3NSSxByF9MSSVIX8PIWSjMw8heBMfz-FlKLMssy8dAVDQ1ODc3sc9c_tyVVIzEtRyE9L0y0uAStPUzA0yAPJ5PEwsKYl5hSn8kJpbgZVoAXOHroFicXJiTlpRYl5yZnF8QVFmbmJRZXxhkAnmpmamBoTqw4AsUVCcQ</addsrcrecordid><sourcetype>Index Database</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>45nm nMOSFET with metal gate on thin SiON driving 1150μA/μm and off-state of 10nA/μn</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>HENSON, K ; LANDER, R. J. P ; BECKX, S ; BOULLART, W ; COENEGRACHTS, B ; VERTOMMEN, J ; RICHARD, O ; BENDER, H ; VANDERVORST, W ; KAISER, M ; EVERAERT, J.-L ; JURCZAK, M ; DEMAND, M ; BIESEMANS, S ; DACHS, C. J. J ; KACZER, B ; DEWEERD, W ; SCHRAM, T ; TOKEI, Z ; HOOKER, J. C ; CUBAYNES, F. N</creator><creatorcontrib>HENSON, K ; LANDER, R. J. P ; BECKX, S ; BOULLART, W ; COENEGRACHTS, B ; VERTOMMEN, J ; RICHARD, O ; BENDER, H ; VANDERVORST, W ; KAISER, M ; EVERAERT, J.-L ; JURCZAK, M ; DEMAND, M ; BIESEMANS, S ; DACHS, C. J. J ; KACZER, B ; DEWEERD, W ; SCHRAM, T ; TOKEI, Z ; HOOKER, J. C ; CUBAYNES, F. N</creatorcontrib><identifier>ISBN: 0780386841</identifier><identifier>ISBN: 9780780386846</identifier><language>eng</language><publisher>Piscataway NJ: IEEE</publisher><subject>Applied sciences ; Electronics ; Exact sciences and technology ; Microelectronic fabrication (materials and surfaces technology) ; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices ; Transistors</subject><ispartof>2004 International Electron Devices Meeting, 2004, p.851-854</ispartof><rights>2006 INIST-CNRS</rights><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>309,310,780,784,789,790,4050,4051</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=17806545$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>HENSON, K</creatorcontrib><creatorcontrib>LANDER, R. J. P</creatorcontrib><creatorcontrib>BECKX, S</creatorcontrib><creatorcontrib>BOULLART, W</creatorcontrib><creatorcontrib>COENEGRACHTS, B</creatorcontrib><creatorcontrib>VERTOMMEN, J</creatorcontrib><creatorcontrib>RICHARD, O</creatorcontrib><creatorcontrib>BENDER, H</creatorcontrib><creatorcontrib>VANDERVORST, W</creatorcontrib><creatorcontrib>KAISER, M</creatorcontrib><creatorcontrib>EVERAERT, J.-L</creatorcontrib><creatorcontrib>JURCZAK, M</creatorcontrib><creatorcontrib>DEMAND, M</creatorcontrib><creatorcontrib>BIESEMANS, S</creatorcontrib><creatorcontrib>DACHS, C. J. J</creatorcontrib><creatorcontrib>KACZER, B</creatorcontrib><creatorcontrib>DEWEERD, W</creatorcontrib><creatorcontrib>SCHRAM, T</creatorcontrib><creatorcontrib>TOKEI, Z</creatorcontrib><creatorcontrib>HOOKER, J. C</creatorcontrib><creatorcontrib>CUBAYNES, F. N</creatorcontrib><title>45nm nMOSFET with metal gate on thin SiON driving 1150μA/μm and off-state of 10nA/μn</title><title>2004 International Electron Devices Meeting</title><subject>Applied sciences</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Microelectronic fabrication (materials and surfaces technology)</subject><subject>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><subject>Transistors</subject><isbn>0780386841</isbn><isbn>9780780386846</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2004</creationdate><recordtype>conference_proceeding</recordtype><recordid>eNpjZuAyMLcwMLYwszAx5GDgLS7OMgACE1MTAwtjToZwE9O8XIU8X_9gN9cQhfLMkgyF3NSSxByF9MSSVIX8PIWSjMw8heBMfz-FlKLMssy8dAVDQ1ODc3sc9c_tyVVIzEtRyE9L0y0uAStPUzA0yAPJ5PEwsKYl5hSn8kJpbgZVoAXOHroFicXJiTlpRYl5yZnF8QVFmbmJRZXxhkAnmpmamBoTqw4AsUVCcQ</recordid><startdate>2004</startdate><enddate>2004</enddate><creator>HENSON, K</creator><creator>LANDER, R. J. P</creator><creator>BECKX, S</creator><creator>BOULLART, W</creator><creator>COENEGRACHTS, B</creator><creator>VERTOMMEN, J</creator><creator>RICHARD, O</creator><creator>BENDER, H</creator><creator>VANDERVORST, W</creator><creator>KAISER, M</creator><creator>EVERAERT, J.-L</creator><creator>JURCZAK, M</creator><creator>DEMAND, M</creator><creator>BIESEMANS, S</creator><creator>DACHS, C. J. J</creator><creator>KACZER, B</creator><creator>DEWEERD, W</creator><creator>SCHRAM, T</creator><creator>TOKEI, Z</creator><creator>HOOKER, J. C</creator><creator>CUBAYNES, F. N</creator><general>IEEE</general><scope>IQODW</scope></search><sort><creationdate>2004</creationdate><title>45nm nMOSFET with metal gate on thin SiON driving 1150μA/μm and off-state of 10nA/μn</title><author>HENSON, K ; LANDER, R. J. P ; BECKX, S ; BOULLART, W ; COENEGRACHTS, B ; VERTOMMEN, J ; RICHARD, O ; BENDER, H ; VANDERVORST, W ; KAISER, M ; EVERAERT, J.-L ; JURCZAK, M ; DEMAND, M ; BIESEMANS, S ; DACHS, C. J. J ; KACZER, B ; DEWEERD, W ; SCHRAM, T ; TOKEI, Z ; HOOKER, J. C ; CUBAYNES, F. N</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-pascalfrancis_primary_178065453</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2004</creationdate><topic>Applied sciences</topic><topic>Electronics</topic><topic>Exact sciences and technology</topic><topic>Microelectronic fabrication (materials and surfaces technology)</topic><topic>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</topic><topic>Transistors</topic><toplevel>online_resources</toplevel><creatorcontrib>HENSON, K</creatorcontrib><creatorcontrib>LANDER, R. J. P</creatorcontrib><creatorcontrib>BECKX, S</creatorcontrib><creatorcontrib>BOULLART, W</creatorcontrib><creatorcontrib>COENEGRACHTS, B</creatorcontrib><creatorcontrib>VERTOMMEN, J</creatorcontrib><creatorcontrib>RICHARD, O</creatorcontrib><creatorcontrib>BENDER, H</creatorcontrib><creatorcontrib>VANDERVORST, W</creatorcontrib><creatorcontrib>KAISER, M</creatorcontrib><creatorcontrib>EVERAERT, J.-L</creatorcontrib><creatorcontrib>JURCZAK, M</creatorcontrib><creatorcontrib>DEMAND, M</creatorcontrib><creatorcontrib>BIESEMANS, S</creatorcontrib><creatorcontrib>DACHS, C. J. J</creatorcontrib><creatorcontrib>KACZER, B</creatorcontrib><creatorcontrib>DEWEERD, W</creatorcontrib><creatorcontrib>SCHRAM, T</creatorcontrib><creatorcontrib>TOKEI, Z</creatorcontrib><creatorcontrib>HOOKER, J. C</creatorcontrib><creatorcontrib>CUBAYNES, F. N</creatorcontrib><collection>Pascal-Francis</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>HENSON, K</au><au>LANDER, R. J. P</au><au>BECKX, S</au><au>BOULLART, W</au><au>COENEGRACHTS, B</au><au>VERTOMMEN, J</au><au>RICHARD, O</au><au>BENDER, H</au><au>VANDERVORST, W</au><au>KAISER, M</au><au>EVERAERT, J.-L</au><au>JURCZAK, M</au><au>DEMAND, M</au><au>BIESEMANS, S</au><au>DACHS, C. J. J</au><au>KACZER, B</au><au>DEWEERD, W</au><au>SCHRAM, T</au><au>TOKEI, Z</au><au>HOOKER, J. C</au><au>CUBAYNES, F. N</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>45nm nMOSFET with metal gate on thin SiON driving 1150μA/μm and off-state of 10nA/μn</atitle><btitle>2004 International Electron Devices Meeting</btitle><date>2004</date><risdate>2004</risdate><spage>851</spage><epage>854</epage><pages>851-854</pages><isbn>0780386841</isbn><isbn>9780780386846</isbn><cop>Piscataway NJ</cop><pub>IEEE</pub></addata></record> |
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identifier | ISBN: 0780386841 |
ispartof | 2004 International Electron Devices Meeting, 2004, p.851-854 |
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language | eng |
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source | IEEE Electronic Library (IEL) Conference Proceedings |
subjects | Applied sciences Electronics Exact sciences and technology Microelectronic fabrication (materials and surfaces technology) Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Transistors |
title | 45nm nMOSFET with metal gate on thin SiON driving 1150μA/μm and off-state of 10nA/μn |
url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-07T04%3A17%3A31IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-pascalfrancis&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=45nm%20nMOSFET%20with%20metal%20gate%20on%20thin%20SiON%20driving%201150%CE%BCA/%CE%BCm%20and%20off-state%20of%2010nA/%CE%BCn&rft.btitle=2004%20International%20Electron%20Devices%20Meeting&rft.au=HENSON,%20K&rft.date=2004&rft.spage=851&rft.epage=854&rft.pages=851-854&rft.isbn=0780386841&rft.isbn_list=9780780386846&rft_id=info:doi/&rft_dat=%3Cpascalfrancis%3E17806545%3C/pascalfrancis%3E%3Cgrp_id%3Ecdi_FETCH-pascalfrancis_primary_178065453%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |