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Visual inspection of textile surfaces with translation invariant wavelet shrinkage

A visual inspection method of textile surfaces using the translation invariant wavelet shrinkage is presented. The wavelet transform, while the Mallat algorithm can compute it efficiently, has the translation variance problem. To deal with this problem, we use RI-spline wavelets, which are pseudo co...

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Main Authors:	Fujiwara, H., Zhong Zhang, Hatta, H., Koshimizu, H.
Format:	Conference Proceeding
Language:	English
Subjects:	Algorithm design and analysis Applied sciences Computational efficiency Exact sciences and technology Frequency Image processing Image texture analysis Information, signal and communications theory Inspection Signal processing Spline Surface waves Telecommunications and information theory Textiles Wavelet analysis Wavelet transforms
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creator	Fujiwara, H. Zhong Zhang Hatta, H. Koshimizu, H.
description	A visual inspection method of textile surfaces using the translation invariant wavelet shrinkage is presented. The wavelet transform, while the Mallat algorithm can compute it efficiently, has the translation variance problem. To deal with this problem, we use RI-spline wavelets, which are pseudo complex wavelets, consist of a pair of a symmetric bi-orthogonal spline wavelet and an anti-symmetric bi-orthogonal spline wavelet, for textile surface inspection. In our approach, we remove the regular information which consists of the textile textures and the shading effects caused by uneven lighting from the textile surfaces to be inspected, using the translation invariant wavelet shrinkage realized using 2D RI-spline wavelets. The experimental results show that our inspection method is effective for detecting tiny defects as well as global defects such as dyeing unevenness.
doi_str_mv	10.1109/IECON.2004.1431755
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fullrecord	<record><control><sourceid>pascalfrancis_6IE</sourceid><recordid>TN_cdi_pascalfrancis_primary_17853936</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>1431755</ieee_id><sourcerecordid>17853936</sourcerecordid><originalsourceid>FETCH-LOGICAL-i135t-1db0e9b3c32d824e1b239b3ba3e8b72c80b283c96d87ac269f86ea9b7a03086f3</originalsourceid><addsrcrecordid>eNpFkEFLAzEQhQMiKLV_QC-5eGydZLqb5CilaqFYEPVaJumsja7bsklb_fcuruAw8Hi8j-ExQlwqGCsF7mY-my4fxxpgMlYTVKYoTsTQGQvdojUIcCaGKb1DN-gKsO5cPL3GtKdaxibtOOS4beS2kpm_cqxZpn1bUeAkjzFvZG6pSTX9QrE5UBupyfJIB645y7RpY_NBb3whTiuqEw__dCBe7mbP04fRYnk_n94uRlFhkUdq7YGdx4B6bfWEldfYWU_I1hsdLHhtMbhybQ0FXbrKlkzOGwIEW1Y4ENf93R2lQHXVtQsxrXZt_KT2e6WMLdBh2XFXPReZ-T_uP4Q_uSZdXg</addsrcrecordid><sourcetype>Index Database</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Visual inspection of textile surfaces with translation invariant wavelet shrinkage</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Fujiwara, H. ; Zhong Zhang ; Hatta, H. ; Koshimizu, H.</creator><creatorcontrib>Fujiwara, H. ; Zhong Zhang ; Hatta, H. ; Koshimizu, H.</creatorcontrib><description>A visual inspection method of textile surfaces using the translation invariant wavelet shrinkage is presented. The wavelet transform, while the Mallat algorithm can compute it efficiently, has the translation variance problem. To deal with this problem, we use RI-spline wavelets, which are pseudo complex wavelets, consist of a pair of a symmetric bi-orthogonal spline wavelet and an anti-symmetric bi-orthogonal spline wavelet, for textile surface inspection. In our approach, we remove the regular information which consists of the textile textures and the shading effects caused by uneven lighting from the textile surfaces to be inspected, using the translation invariant wavelet shrinkage realized using 2D RI-spline wavelets. The experimental results show that our inspection method is effective for detecting tiny defects as well as global defects such as dyeing unevenness.</description><identifier>ISBN: 9780780387300</identifier><identifier>ISBN: 0780387309</identifier><identifier>DOI: 10.1109/IECON.2004.1431755</identifier><language>eng</language><publisher>Piscataway NJ: IEEE</publisher><subject>Algorithm design and analysis ; Applied sciences ; Computational efficiency ; Exact sciences and technology ; Frequency ; Image processing ; Image texture analysis ; Information, signal and communications theory ; Inspection ; Signal processing ; Spline ; Surface waves ; Telecommunications and information theory ; Textiles ; Wavelet analysis ; Wavelet transforms</subject><ispartof>30th Annual Conference of IEEE Industrial Electronics Society, 2004. IECON 2004, 2004, Vol.2, p.1252-1257 Vol. 2</ispartof><rights>2006 INIST-CNRS</rights><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/1431755$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,776,780,785,786,2052,4036,4037,27902,54895</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/1431755$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=17853936$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Fujiwara, H.</creatorcontrib><creatorcontrib>Zhong Zhang</creatorcontrib><creatorcontrib>Hatta, H.</creatorcontrib><creatorcontrib>Koshimizu, H.</creatorcontrib><title>Visual inspection of textile surfaces with translation invariant wavelet shrinkage</title><title>30th Annual Conference of IEEE Industrial Electronics Society, 2004. IECON 2004</title><addtitle>IECON</addtitle><description>A visual inspection method of textile surfaces using the translation invariant wavelet shrinkage is presented. The wavelet transform, while the Mallat algorithm can compute it efficiently, has the translation variance problem. To deal with this problem, we use RI-spline wavelets, which are pseudo complex wavelets, consist of a pair of a symmetric bi-orthogonal spline wavelet and an anti-symmetric bi-orthogonal spline wavelet, for textile surface inspection. In our approach, we remove the regular information which consists of the textile textures and the shading effects caused by uneven lighting from the textile surfaces to be inspected, using the translation invariant wavelet shrinkage realized using 2D RI-spline wavelets. The experimental results show that our inspection method is effective for detecting tiny defects as well as global defects such as dyeing unevenness.</description><subject>Algorithm design and analysis</subject><subject>Applied sciences</subject><subject>Computational efficiency</subject><subject>Exact sciences and technology</subject><subject>Frequency</subject><subject>Image processing</subject><subject>Image texture analysis</subject><subject>Information, signal and communications theory</subject><subject>Inspection</subject><subject>Signal processing</subject><subject>Spline</subject><subject>Surface waves</subject><subject>Telecommunications and information theory</subject><subject>Textiles</subject><subject>Wavelet analysis</subject><subject>Wavelet transforms</subject><isbn>9780780387300</isbn><isbn>0780387309</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2004</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><recordid>eNpFkEFLAzEQhQMiKLV_QC-5eGydZLqb5CilaqFYEPVaJumsja7bsklb_fcuruAw8Hi8j-ExQlwqGCsF7mY-my4fxxpgMlYTVKYoTsTQGQvdojUIcCaGKb1DN-gKsO5cPL3GtKdaxibtOOS4beS2kpm_cqxZpn1bUeAkjzFvZG6pSTX9QrE5UBupyfJIB645y7RpY_NBb3whTiuqEw__dCBe7mbP04fRYnk_n94uRlFhkUdq7YGdx4B6bfWEldfYWU_I1hsdLHhtMbhybQ0FXbrKlkzOGwIEW1Y4ENf93R2lQHXVtQsxrXZt_KT2e6WMLdBh2XFXPReZ-T_uP4Q_uSZdXg</recordid><startdate>2004</startdate><enddate>2004</enddate><creator>Fujiwara, H.</creator><creator>Zhong Zhang</creator><creator>Hatta, H.</creator><creator>Koshimizu, H.</creator><general>IEEE</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope><scope>IQODW</scope></search><sort><creationdate>2004</creationdate><title>Visual inspection of textile surfaces with translation invariant wavelet shrinkage</title><author>Fujiwara, H. ; Zhong Zhang ; Hatta, H. ; Koshimizu, H.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i135t-1db0e9b3c32d824e1b239b3ba3e8b72c80b283c96d87ac269f86ea9b7a03086f3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2004</creationdate><topic>Algorithm design and analysis</topic><topic>Applied sciences</topic><topic>Computational efficiency</topic><topic>Exact sciences and technology</topic><topic>Frequency</topic><topic>Image processing</topic><topic>Image texture analysis</topic><topic>Information, signal and communications theory</topic><topic>Inspection</topic><topic>Signal processing</topic><topic>Spline</topic><topic>Surface waves</topic><topic>Telecommunications and information theory</topic><topic>Textiles</topic><topic>Wavelet analysis</topic><topic>Wavelet transforms</topic><toplevel>online_resources</toplevel><creatorcontrib>Fujiwara, H.</creatorcontrib><creatorcontrib>Zhong Zhang</creatorcontrib><creatorcontrib>Hatta, H.</creatorcontrib><creatorcontrib>Koshimizu, H.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Xplore</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection><collection>Pascal-Francis</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Fujiwara, H.</au><au>Zhong Zhang</au><au>Hatta, H.</au><au>Koshimizu, H.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Visual inspection of textile surfaces with translation invariant wavelet shrinkage</atitle><btitle>30th Annual Conference of IEEE Industrial Electronics Society, 2004. IECON 2004</btitle><stitle>IECON</stitle><date>2004</date><risdate>2004</risdate><volume>2</volume><spage>1252</spage><epage>1257 Vol. 2</epage><pages>1252-1257 Vol. 2</pages><isbn>9780780387300</isbn><isbn>0780387309</isbn><abstract>A visual inspection method of textile surfaces using the translation invariant wavelet shrinkage is presented. The wavelet transform, while the Mallat algorithm can compute it efficiently, has the translation variance problem. To deal with this problem, we use RI-spline wavelets, which are pseudo complex wavelets, consist of a pair of a symmetric bi-orthogonal spline wavelet and an anti-symmetric bi-orthogonal spline wavelet, for textile surface inspection. In our approach, we remove the regular information which consists of the textile textures and the shading effects caused by uneven lighting from the textile surfaces to be inspected, using the translation invariant wavelet shrinkage realized using 2D RI-spline wavelets. The experimental results show that our inspection method is effective for detecting tiny defects as well as global defects such as dyeing unevenness.</abstract><cop>Piscataway NJ</cop><pub>IEEE</pub><doi>10.1109/IECON.2004.1431755</doi></addata></record>
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recordid	cdi_pascalfrancis_primary_17853936
source	IEEE Electronic Library (IEL) Conference Proceedings
subjects	Algorithm design and analysis Applied sciences Computational efficiency Exact sciences and technology Frequency Image processing Image texture analysis Information, signal and communications theory Inspection Signal processing Spline Surface waves Telecommunications and information theory Textiles Wavelet analysis Wavelet transforms
title	Visual inspection of textile surfaces with translation invariant wavelet shrinkage
url	http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-03T13%3A59%3A31IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-pascalfrancis_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Visual%20inspection%20of%20textile%20surfaces%20with%20translation%20invariant%20wavelet%20shrinkage&rft.btitle=30th%20Annual%20Conference%20of%20IEEE%20Industrial%20Electronics%20Society,%202004.%20IECON%202004&rft.au=Fujiwara,%20H.&rft.date=2004&rft.volume=2&rft.spage=1252&rft.epage=1257%20Vol.%202&rft.pages=1252-1257%20Vol.%202&rft.isbn=9780780387300&rft.isbn_list=0780387309&rft_id=info:doi/10.1109/IECON.2004.1431755&rft_dat=%3Cpascalfrancis_6IE%3E17853936%3C/pascalfrancis_6IE%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-i135t-1db0e9b3c32d824e1b239b3ba3e8b72c80b283c96d87ac269f86ea9b7a03086f3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=1431755&rfr_iscdi=true