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Secondary electron yield measurements from materials with application to collectors of high-power microwave devices: High-power microwave generation
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Published in: | IEEE transactions on plasma science 2006, Vol.34 (3), p.642-651 |
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Main Authors: | , , , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Online Access: | Get full text |
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ISSN: | 0093-3813 1939-9375 |