Loading…

Room temperature contactless electroreflectance characterization of InGaAs/InAs/GaAs quantum dot wafers

Saved in:

Bibliographic Details
Published in:	Semiconductor science and technology 2006-10, Vol.21 (10), p.1402-1407
Main Authors:	Motyka, M, Kudrawiec, R, Sęk, G, Misiewicz, J, Krestnikov, I L, Mikhrin, S, Kovsh, A
Format:	Article
Language:	English
Subjects:	Condensed matter: electronic structure, electrical, magnetic, and optical properties Exact sciences and technology Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation Optical properties of low-dimensional, mesoscopic, and nanoscale materials and structures Physics Quantum dots
Citations:	Items that this one cites Items that cite this one
Online Access:	Get full text
Tags:	Add Tag No Tags, Be the first to tag this record!