X-Ray and Electrooptical Studies of Liquid Crystal Siloxane with a de Vries SmA Phase

We present the X-ray diffraction, polarizing optical microscopy and electrooptic response studies of the chiral liquid crystal siloxane DSi3-MR11 [ 1 ] with a de Vries-type behavior. In a wide temperature range (Δ T ∼ 50°C) the material shows no layer shrinkage but a weak nearly linear layer spacing...

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Bibliographic Details
Published in:Ferroelectrics 2006-01, Vol.343 (1), p.101-110
Main Authors: Goc, F., Blanc, Ch, Lorman, V., Nobili, M., Samaritani, S., Galli, G., Kuczyński, W.
Format: Article
Language:English
Subjects:
Condensed Matter
Condensed matter: electronic structure, electrical, magnetic, and optical properties
de Vries
Electrooptical effects
electrooptics
Exact sciences and technology
Materials Science
Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation
Optical properties of bulk materials and thin films
optics
Physics
smectic A phase
X-ray
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Summary:We present the X-ray diffraction, polarizing optical microscopy and electrooptic response studies of the chiral liquid crystal siloxane DSi3-MR11 [ 1 ] with a de Vries-type behavior. In a wide temperature range (Δ T ∼ 50°C) the material shows no layer shrinkage but a weak nearly linear layer spacing variation with temperature. Neither discontinuity nor slope change occurs at the SmA*-SmC* transition. In addition, using the X-ray data, the unusual electrooptic response in both 1st and 2nd harmonics together with known thermal behavior of birefringence, we evidence the cross-over from the classical orthogonal to the de Vries-like SmA* regime in DSi3-MR11 siloxane.
ISSN:0015-0193
1563-5112
DOI:10.1080/00150190600962176