Modeling electrical characteristics of thin-film field-effect transistors. II: Effects of traps and impurities

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Bibliographic Details
Published in:Synthetic metals 2006-12, Vol.156 (21-24), p.1316-1326
Main Authors: STALLINEA, P, GOMES, H. L
Format: Article
Language:English
Subjects:
Applied sciences
Electronics
Exact sciences and technology
Materials
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Transistors
Online Access:Get full text
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ISSN:0379-6779
1879-3290
DOI:10.1016/j.synthmet.2006.09.008