Spacer defined FinFET: Active area patterning of sub-20 nm fins with high density

• Published in: Microelectronic engineering 2007-04, Vol.84 (4), p.609-618
• Main Authors: Degroote, B., Rooyackers, R., Vandeweyer, T., Collaert, N., Boullart, W., Kunnen, E., Shamiryan, D., Wouters, J., Van Puymbroeck, J., Dixit, A., Jurczak, M.
• Format: Article
• Language: English
• Subjects: Applied sciences; Critical dimension (CD); Electronics; Exact sciences and technology; Fin; Line width roughness (LWR); Microelectronic fabrication (materials and surfaces technology); MuGFET; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices; Spacer defined patterning; Sub-20 nm pattern; Transistors
• ISSN: 0167-9317; 1873-5568
• DOI: 10.1016/j.mee.2006.12.003

We present a method to obtain Si-fins with a critical dimension (CD) below 20 nm, separated by a minimum distance of 25 nm and connected by a common source/drain (S/D) pad. The method comprises of recursive spacer defined patterning to quadruple the line density of a 350 nm pitch resist pattern defined by 193 nm lithography. Spacer defined patterning is combined with resist based patterning to simultaneously define fins and S/D pads in a Silicon on Insulator (SOI) film. CD and Line Width Roughness (LWR) analysis was done on top down SEM images taken in a center die and in an edge die of a 200 mm wafer. The average CD is 17 nm in the center of the wafer and 18 nm at the edge. The LWR is 3 nm for both center and edge. Additional process steps to remove etch damage and round the top corner of the fin (i.e. oxidation followed by H 2 anneal) further reduce the CD to 13 nm.