Modular extension of ATE to 5 Gbps

• Main Authors: Keezer, D.C., Minier, D., Paradis, M., Binette, L.
• Format: Conference Proceeding
• Language: English
• Subjects: Accuracy; Applied sciences; Automatic testing; Calibration; Circuit properties; Circuit testing; Electric, optical and optoelectronic circuits; Electronic circuits; Electronics; Exact sciences and technology; Jitter; Production; Sampling methods; Switching, multiplexing, switched capacity circuits; System testing; Test equipment; Testing, measurement, noise and reliability; Timing
• DOI: 10.1109/TEST.2004.1387337

Existing digital automated test equipment (ATE) can provide signals at about 1 Gbps or slightly higher. To accommodate multi-GHz test needs, some ATE provide options for a few faster channels (up to 3.6 Gbps). However, leading-edge parts may require 100s of these signals and in some cases at even higher speeds (5 and 10 Gbps). This work describes a modular approach that allows for as many as 144 multiplexing and/or sampling channels to be added to existing ATE. The modules developed, so far include multiplexers, demultiplexers, and high-speed samplers that each support multiple high-speed differential signals. Production units operating up to 2.5 Gbps were introduced. We provide more detailed characterization of these modules and describe new modules targeting 3.2 Gbps and 5.0 Gbps applications. Various re-clocking techniques and proprietary calibration methods are used in order to reduce timing errors (especially jitter) to the sub-50ps range. The general system configuration, and key features of the newly developed modules are presented.