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Planning step-stress life-test with a target acceleration-factor

A sequential approach is presented to plan a multiple-steps step-stress accelerated life test (SSALT) with type-I censoring so as to achieve a pre-specified acceleration factor. An initial optimal plan for a simple SSALT, where one not only has to determine the optimum hold-time under low stress but...

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Bibliographic Details
Published in:IEEE transactions on reliability 1999-03, Vol.48 (1), p.61-67
Main Authors: YEO, K.-P, TANG, L.-C
Format: Article
Language:English
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Summary:A sequential approach is presented to plan a multiple-steps step-stress accelerated life test (SSALT) with type-I censoring so as to achieve a pre-specified acceleration factor. An initial optimal plan for a simple SSALT, where one not only has to determine the optimum hold-time under low stress but also the optimum low stress level, is obtained by solving a constrained nonlinear program. A backward recursion scheme generates the subsequent optimal low-stress levels and hold-times for multiple-step SSALT. An illustration using a 3-step SSALT is presented. The relative efficiency of the 2-step and 3-step SSALT is investigated. A numerical example illustrates the method under 2-step and 3-step SSALT.
ISSN:0018-9529
1558-1721
DOI:10.1109/24.765928