On the low-frequency noise of pmosfets with eMOSFETs SiGe Source/Drain and fully silicided metal gate

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Bibliographic Details
Published in:IEEE electron device letters 2007, Vol.28 (11), p.987-989
Main Authors: SIMOEN, E, VERHEYEN, P, SHICKOVA, A, LOO, R, CLAEYS, C, MEMBER, Senior
Format: Article
Language:English
Subjects:
Applied sciences
Electronics
Exact sciences and technology
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Transistors
Online Access:Get full text
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ISSN:0741-3106
1558-0563