Characterization and performance evaluation of coupled multiwaveguide arrays

A new and effective nonintrusive method for characterization of N coupled waveguides is presented. The method is able to furnish readily the coupling parameters of most significance, and furnishes in addition, a way of assessment of overall device quality and performance. The procedure is based on a...

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Bibliographic Details
Published in:Journal of lightwave technology 1999-10, Vol.17 (10), p.1884-1889
Main Authors: Kaplan, A., Ruschin, S.
Format: Article
Language:English
Subjects:
Applied sciences
Arrays
Assessments
Circuit properties
Coupled modes
Coupling coefficients
Crystals
Devices
Electric, optical and optoelectronic circuits
Electronics
Exact sciences and technology
Integrated optics
Integrated optics. Optical fibers and wave guides
Joining
Optical and optoelectronic circuits
Optical coupling
Optical devices
Optical polarization
Optical waveguides
Titanium
Transmission line matrix methods
Wavelength measurement
Wavelengths
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Description
Summary:A new and effective nonintrusive method for characterization of N coupled waveguides is presented. The method is able to furnish readily the coupling parameters of most significance, and furnishes in addition, a way of assessment of overall device quality and performance. The procedure is based on a semi-empirical implementation of coupled mode theory, by means of which different functions are defined for different input configurations. In a well-functioning device, all these function should attain a common single minimum, out of which the coupling coefficient and additional parameters of the device are deduced. Devices were fabricated on Z-cut LiNbO/sub 3/ crystals by in-diffusion of titanium. The method was applied in order to measure the wavelength and polarization dependence of the coupling coefficient.
ISSN:0733-8724
1558-2213
DOI:10.1109/50.793771