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Avalanche multiplication in a compact bipolar transistor model for circuit simulation

A simple weak avalanche model valid in a wide range of voltages and currents, is presented. The proposed model is derived by using the base-collector depletion capacitance for predicting the avalanche current. The model needs only one additional transistor parameter; the extraction method and temper...

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Bibliographic Details
Published in:IEEE transactions on electron devices 1989-07, Vol.36 (7), p.1376-1380
Main Authors: Kloosterman, W.J., De Graaff, H.C.
Format: Article
Language:English
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Summary:A simple weak avalanche model valid in a wide range of voltages and currents, is presented. The proposed model is derived by using the base-collector depletion capacitance for predicting the avalanche current. The model needs only one additional transistor parameter; the extraction method and temperature dependence of this parameter are discussed. The decrease in avalanche current for high collector current densities may originate from internal device heating, a voltage drop in the epilayer, or mobile carriers in the depleted part. From experimental results it is concluded that, below a critical hot-carrier current, the decrease in avalanche current due to mobile carriers is negligible.< >
ISSN:0018-9383
1557-9646
DOI:10.1109/16.30944