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Equilibrium critical thickness for Si1-xGex strained layers on (100) Si

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Bibliographic Details
Published in:	Applied physics letters 1990-01, Vol.56 (5), p.460-462
Main Authors:	HOUGHTON, D. C, GIBBINGS, C. J, TUPPEN, C. G, LYONS, M. H, HALLIWELL, M. A. G
Format:	Article
Language:	English
Subjects:	Condensed matter: structure, mechanical and thermal properties Exact sciences and technology Physics Solid surfaces and solid-solid interfaces Surface and interface dynamics and vibrations Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties) Thin film structure and morphology
Online Access:	Get full text
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